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弹用电磁继电器贮存退化试验及其寿命预测方法
Storage degradation testing and life prediction for missile electromagnetic relay

DOI: 10.13700/j.bh.1001-5965.2015.0789

Keywords: 电磁继电器(EMR),接触电阻,贮存可靠性,退化试验,自回归滑动平均(ARMA)模型,小波变换,寿命预测
electromagnetic relay (EMR)
,contact resistance,storage reliability,degradation testing,autoregressive moving average (ARMA) model,wavelet transform,life prediction

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Abstract:

摘要 弹用电磁继电器(EMR)是国防武器系统中重要的机电元件,负责信号传递、电路保护与控制、负载切换等功能,对弹用EMR贮存可靠性的可靠评估已成为亟待解决的问题。以装备应用普遍的某型弹用EMR为例,提出一种考虑性能退化的贮存可靠性试验和评价方法。通过研制的弹用EMR贮存退化试验综合系统,获得了其贮存退化敏感参数的变化情况,对弹用EMR的贮存可靠性建模方法进行了探索性研究。提出了基于时间序列分析和小波变换方法的实测参数预处理方法,提高了预测精度。通过回归理论估计了贮存退化模型的参数,并用所建模型对弹用EMR正常温度应力下的贮存寿命进行了预测。
Abstract:Missile electromagnetic relay (EMR) is one of the key electromechanical components used for signal transmission, load switching and circuit protection in defense weapon system. How to reliably evaluate the storage reliability of missile EMR has become the most important problem that is urgent to be solved. This study used missile EMR as research object. A new method for testing storage reliability is proposed by performance parameters degradation. The test and analysis system of missile EMR storage parameters was designed and developed. Based on the analysis of parameters changing in storage degradation testing, the modeling storage reliability method of missile EMR is extensively investigated. Prediction parameters preprocessing method is proposed which is based on time series analysis with wavelet transform method. And in this way, the prediction accuracy is increased. Parameters of the storage degradation model are estimated through the regression theory, and the storage life of missile EMR under normal stress is predicted.

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