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- 2015
尖牙远中微植体支抗植入区域口腔颌面部锥形束CT测量分析
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Abstract:
摘要 目的:通过测量上、下颌骨尖牙与第一前磨牙之间不同水平处颊侧骨皮质的厚度以及根间距离,为微植体支抗植入的最佳位点提供依据。方法:随机选择武汉大学口腔医院就诊患者的口腔颌面部锥形束CT影像资料29例,测量双侧上、下颌骨尖牙与第一前磨牙间距离牙槽嵴顶3 mm、4 mm、5 mm、6 mm、7 mm不同水平处颊侧骨皮质的厚度及根间距离,并对测量数据进行统计分析。结果:上下颌尖牙与第一前磨牙间3~7 mm水平骨皮质厚度均大于1 mm,上颌自3 mm向根尖骨皮质厚度逐渐增加,下颌4 mm处骨皮质最薄,自5 mm向根尖方向骨皮质厚度逐渐增加。上下颌尖牙与第一前磨牙间3~7 mm水平牙根间距均大于2 mm,上、下颌骨距牙槽嵴顶3 mm处牙根间距最短,向根尖方向根间距离逐渐增大;双侧上下颌骨3~7 mm各水平骨皮质厚度及根间距离的差异没有统计学意义。结论:上下颌尖牙远中区在距离牙槽嵴顶≥3 mm处骨质可作为微植体的安全植入区域;通过口腔颌面部锥形束CT对微植体植入区域骨皮质厚度及根间距离的测量分析,可以向临床提供精确的数据支持
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