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Optoelectronics 2016
基于MATLAB GUI的相位测量轮廓术
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Abstract:
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[4] | Bian, X.T., Xue, J.P., Cheng, J., et al. (2013) Phase Measuring Profilometry Based on Elliptically Pattern Grating. Optik, 124, 3924-3928. http://dx.doi.org/10.1016/j.ijleo.2012.11.042 |
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