Graphene Oxide (GO) was chemically synthesized from Natural Flake Graphite (NFG). The GO was
chemically reduced to Reduced Graphene Oxide (RGO) using hydrazine monohydrate. Thin films of
GO and RGO were also deposited on sodalime glass substrate using spray pyrolysis technique (SPT).
The samples were characterized using Fourier Transform Infrared (FTIR) spectroscopy, Scanning
Electron Microscopy (SEM) with Energy Dispersive X-Ray (EDS) facility attached to it, UV-Visible
Spectrometry and Four-Point probe. The FTIR spectra showed the addition of oxygen functionality
groups in GO while such groups was drastically reduced in RGO. SEM micrograph of GO thin film
showed a porous sponge-like structure while the micrograph of RGO thin film showed evenly distributed
and well connected graphene structure. The EDX spectrum of RGO showed that there was
decrease in oxygen content and increase in carbon content of RGO when compared to GO. The optical
analysis of the GO and RGO thin films gave a direct energy bandgap of 2.7 eV and 2.2 eV respectively.
The value of sheet resistance of GO and RGO films was determined to be 22.9 × 106Ω/sq and 4.95 ×
106Ω/sq respectively.
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