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电子学报  2015 

微波设备表面电磁泄漏位置检测方法研究

DOI: 10.3969/j.issn.0372-2112.2015.06.028, PP. 1224-1230

Keywords: 电磁泄漏,微波设备,成像,综合孔径,数字透镜,物理透镜

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Abstract:

针对微波设备表面电磁泄漏位置的检测方法进行研究,根据其表面等效辐射源形式的不同,设计了不同的检测方法,并提出了相应的实验测试方案.其中,综合孔径被动辐射计成像的方法适用于表面等效辐射源为非相干源的情况;数字透镜相移成像的方法适用于表面等效辐射源为相干源的情况;物理透镜成像的方法适用于表面等效辐射源为非相干源、相干源和部分相干源的全部三种情况.

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