Wu C F.On the convergence property of the EM algorithm[J].Annals of Statistics, 1983, 11(1):95-103.
[2]
彭宝华, 周经伦, 冯静, 刘学敏.金属化膜脉冲电容器剩余寿命预测方法研究[J].电子学报, 2011, 39(11):2674-2679. Peng B H, Zhou J L, Feng J, Liu X M.Residual lifetime prediction of metallized film pulse capacitors[J].Acta Electronica Sinica, 2011, 39(11):2674-2679.(in Chinese)
[3]
王小林, 郭波, 程志君.融合多源信息的维纳过程性能退化产品的可靠性评估[J].电子学报, 2012, 40(5):977-982. Wang X L, Guo B, Cheng Z J.Reliability assessment of products with Wiener process degradation by fusing multiple information[J].Acta Electronica Sinica, 2012, 40(5):977-982.(in Chinese)
[4]
钟强晖, 张志华, 李大伟.基于性能退化的电子产品筛选试验设计[J].电子学报, 2013, 41(9):1788-1793. Zhong Q H, Zhang Z H, LI D W.Screening test design for electronics based on performance degradation[J].Acta Electronica Sinica, 2013, 41(9):1788-1793.(in Chinese)
[5]
Saha B, Goebel K, Poll S, Christophersen J.Prognostics methods for battery health monitoring using a Bayesian framework[J].IEEE Transactions on Instrumentation Measurement, 2009, 58(2):291-296.
[6]
Si X S, Wang W B, Hu C H, et al.Remaining useful life estimation—A review on the statistical data driven approaches[J].European Journal of Operational Research, 2011, 213(1):1-14.
[7]
Meeker W Q, Escobar L A.A review of recent research and current issues in accelerated testing[J].International Statistical Review, 1993, 61(1):147-168.
[8]
司小胜, 胡昌华, 周东华.带测量误差的非线性退化过程建模与剩余寿命估计[J].自动化学报, 2013, 39(5):590-601. Si X S, Hu C H, Zhou D H.Nonlinear degradation process modeling and remaining useful life estimation subject to measurement error[J].Acta Automatica Sinica, 2013, 39(5):590-601.(in Chinese)
[9]
Gertsbackh I B, Kordonskiy K B.Models of Failure[M].New York:Springer-Verlag, 1969.
[10]
Nelson W.Accelerated Testing:Statistical Models, Test Plans and Data Analyses[M].New York:Wiley, 1990.
[11]
Lu C J, Meeker W Q.Using degradation measures to estimate a time-to-failure distribution[J].Technometrics, 1993, 35(2):161-174
[12]
周东华, 魏慕恒, 司小胜.工业过程异常检测、寿命预测与维修决策的研究进展[J].自动化学报, 2013, 39(6):711-722. Zhou D H, Wei M H, Si X S.A survey on anomaly detection, life prediction and maintenance decision for industrial processes[J].Acta Automatica Sinica, 2013, 39(6):711-722.
[13]
Gebraeel N Z, Lawley M A, Li R, et al.Residual-life distributions from component degradation signals:A Bayesian approach[J].IIE Transactions, 2005, 37(6):543-557.
[14]
N Gebraeel.Sensory-updated residual life distributions for components with exponential degradation patterns[J].IEEE Transactions on Automation Science and Engineering, 2006, 3(4):382-393.
[15]
Gebraeel N Z, Elwany A, Pan J.Residual life predictions in the absence of prior degradation knowledge[J].IEEE Transactions on Reliability, 2009, 58(1):106-117.
[16]
Elwany A, Gebraeel N Z, Maillart L.Structured replacement policies for systems with complex degradation processes and dedicated sensors[J].Operations Research, 2011, 59(3):684-695.
[17]
Si X S, Wang W B, Hu C H, Zhou D H, Pecht M.Remaining useful life estimation based on a nonlinear diffusion degradation process[J].IEEE Transactions on Reliability, 2012, 61(1), 50-67.
[18]
Park C, Padgett W J.Stochastic degradation models with several accelerating variables[J].IEEE Transactions on Reliability, 2006, 55(2):379-390.
[19]
Tseng S T, Tang J, Ku L H.Determination of optimal burn-in parameters and residual life for highly reliable products[J].Naval Research Logistics, 2003, 50(1):1-14.
[20]
程龙, 冯静, 孙权, 周经伦, 蔡永超.非连续运行设备贮存-工作联合退化模型及其应用[J].电子学报, 2012, 40(12):2549-2552. Cheng L, Feng J, Sun Q, Zhou J L, Cai Y C.Storage-work joint degradation model for discontinuous-working devices and its application[J].Acta Electronica Sinica, 2012, 40(12):2549-2552.(in Chinese)
[21]
司小胜, 胡昌华, 李娟, 陈茂银.Bayesian更新与EM算法协作下退化数据驱动的剩余寿命估计方法[J].模式识别与人工智能, 2013, 26(4):357-365. Si X S, Hu C H, Li J, Chen M Y.Degradation data-driven remaining useful life estimation approach under collaboration between Bayesian updating and EM algorithm[J].Pattern Recognition and Artificial Intelligence, 2013, 26(4):357-365.(in Chinese)
[22]
周鑫.基于EM算法的G0分布参数最大似然估计[J].电子学报, 2013, 41(1):178-184. Zhou X.An EM algorithm based maximum likelihood parameter estimation method for the GO distribution[J].Acta Electronica Sinica, 2013, 41(1):178-184.(in Chinese)
[23]
Dempster A P, Laird N M, Rubin D B.Maximum likelihood from incomplete data via the EM algorithm[J].Journal of the Royal Statistical Society Series B, 1977, 39(1):1-38.
