全部 标题 作者
关键词 摘要

OALib Journal期刊
ISSN: 2333-9721
费用:99美元

查看量下载量

相关文章

更多...

线形同轴耦合微波等离子体诊断及硅薄膜制备

DOI: 10.3969/j.issn.1006-7043.201311019

Keywords: 线形同轴耦合微波等离子体, 等离子体诊断, 电子密度, 多晶硅薄膜, 拉曼, XRD

Full-Text   Cite this paper   Add to My Lib

Abstract:

开发了一种新型线形同轴耦合大面积微波等离子体源,针对该新型等离子体源放电空间等离子密度及分布的不明确性,利用朗缪尔单探针法研究了不同放电参数下该等离子体源等离子体密度及空间分布情况.以微波功率,氢氩总流量(氢氩流量比为3:1)和距石英管的距离Z为3个因素设计正交实验探究了宏观放电参量对等离子体参数的影响.测试结果表明该型等离子体源的电子密度均在1010cm-3以上.其次,诊断了在距石英管Z为14 cm处,等离子体参数沿空间水平的分布情况,探究薄膜的最佳沉积区域.最后,根据等离子诊断情况进行硅薄膜的沉积,由XRD结果表明薄膜为多晶结构,拉曼光谱显示沉积硅薄膜晶化率均在92%以上,沉积速率在8 nm/min.

References

[1]  PETASCH W, RAUCHLEA E, MUEGGE H, et al. Duo-plasmaline -a linearly extended homogeneous low pressure plasma source[J].Surface and Coatings Technology, 1997, 93(1): 112-118.
[2]  KAISER M, BAUMGARTNERK M, SCHULZA, et al. Linearly extended plasma source for large-scale applications[J].Surface and Coatings Technology,1999,116-119:552-557.
[3]  RUCHLE E. Dou-plasamaline-a surface wave sustained linearly extended discharge [J]. J Phys Ⅳ France,1988,8(7):99-108.
[4]  KAISEM, URBAN H, EMMIERICH R,et al. A new linearly extended bifocal microwave plasma device[J]. Surface and Coatings Technology, 2001, 142-144:939-942.
[5]  MOTT S H. The theory of collectors in gaseous discharges[J]. Phys Rev, 1926,28(4): 727.
[6]  FEICHTINGER J, SCHULZ A, WALKER M, et al. Sterilisation with low-pressure microwave plasmas[J]. Surface and Coatings Technology, 2003,9-10:564-569.
[7]  DOGGETT B, BUDTZJ C, LUNNEY J G, et al. Behaviour of a planar Langmuir probe in a laser ablation plasma[J]. Applied Surface Science, 2005,247(1-4): 134-138.
[8]  HE Y L, LIU X M, WANG Z C. Study of nano-crystalline silicon films[J]. Science China A,1992(9):995-1021.
[9]  YUE H Y, WU A M, ZHANG X Y, et al. New two-step growth of microcrystalline silicon thin films without incubation layer[J]. Journal of Crystal Growth, 2011,322(1):1-5.
[10]  ZHANG X Y, WUA M, SHI S F, et al. Influence of Ar/H2 ratio on the characteristics of phosphorus-doped hydrogenated nanocrystalline silicon films prepared by electron cyclotron resonance plasma-enhanced chemical vapor deposition[J]. Thin Solid Films, 2012, 521(10):181-184.

Full-Text

Contact Us

service@oalib.com

QQ:3279437679

WhatsApp +8615387084133