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无机纳米杂化聚酰亚胺中电荷陷阱分布的测量

Keywords: 空间电荷, 电介质, 纳米复合物, 电荷陷阱

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Abstract:

为了研究纳米颗粒在聚酰亚胺材料中的作用,利用热激退极化电流方法测量了无机纳米杂化聚酰亚胺薄膜中电荷陷阱的分布.实验表明在495 K左右,聚酰亚胺样品存在一个很宽的热激电流峰,估算了实验样品中电荷陷阱的能级分布在0.45~ 0.75eV.比较了经SiO??2和Al??2O??3纳米杂化聚酰亚胺试样和原始聚酰亚胺试样的电荷陷阱分布情况,发现无机纳米掺杂物的加入明显使材料中的电荷陷阱密度增加.这可能是无机纳米复合聚酰亚胺薄膜耐电晕性能提高的原因之一.同时还发现,SiO??2无机纳米复合聚酰亚胺的陷阱能级密度大于Al??2O??3无机纳米复合聚酰亚胺,说明在聚酰亚胺材料中,SiO??2纳米颗粒比Al??2O??3更有效地引入电荷陷阱.

References

[1]  ORTON K, RICHARD J. New high temperature polyimide insulation for partial discharge resistance in harsh environments [J]. IEEE Electrical Insulation Magazine, 1997, 13(4): 24?30?
[2]  汪佛池,律方成,徐志钮,等, 变频电机用聚酰亚胺薄膜电老化特性研究 [J].高电压技术,2007,33(4): 30?32. ?WANG Fochi,LV Fangcheng, XU zhiniu, et al. Study on electrical aging characteristic of polyimide film used in frequency control motor[J]. High Voltage Engineering, 2007, 33(4):30?32.?
[3]  刘立柱,高琳,宋玉侠,等 偶联剂用量对聚酰亚胺杂化薄膜结构与性能的影响[J]. 功能材料, 2008, 39(5): 814?820. ?LIU Lizhu, GAO Lin, SONG Yuxia, et al. Influence of coupling agents dosage on structure and properties of polyimide hybrid films[J].J Functional Materials, 2008, 39(5): 814?820.
[4]  AHAMD Z, MARK J E. Polymide?Ceramic hybrid composites by the sol?gel route [J]. Chem Mater, 2001, 13(10):3320?3330?
[5]  LIU W D, ZHU B K, ZHANG J. Preparation and dielectric properties of ploymide/silica nanocomposite films prepared from sol?gel and blending process [J]. Polym Adv Technol, 2007, 18(7): 522?528.?
[6]  LEPOT N, VAN BAEL M K, VAN DEN RUL H, et al. Synthesis of platelet?shaped boehmite and γ?alumina nanopaticles via an aqueous route [J]. Ceram Int,2008, 34(8): 1971?1974.?
[7]  TANAKA T, KOZAKO T, FUSE N. Proposal of amulti?core model for polymer nanocomposite dielectrics [J].IEEE Trans Dielec Insul, 2005,12(4): 669?681.
[8]  BISQUERT J, HALPERN V. Analysis by thermally stimulated currents of the frequency power?law domains of the dielectric loss [J]. J Phys Appl Phys,2001, 34: 968?975.
[9]  MAR H A, SIMMONS J G. Determination of the energy distribution of interface traps in MIS systems using non?steady?state techniques [J]. Solid State Electronics, 1974, 17(2): 131?135.
[10]  ZHANG P H, FAN Y, WANG F C, et al. Conduction current characteristics and carrier mobility of both original and corona?resistant polyimide films [J]. Chinese Physics Letters, 2005, 22(5): 1253?1255.

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