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基于配准的红外焦平面阵列条纹非均匀性校正

Keywords: 红外焦平面阵列,条纹非均匀性校正,亮度恒定,配准

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Abstract:

条纹非均匀性是线扫红外焦平面阵列和非制冷凝视型红外焦平面阵列成像系统中一种特殊的固定图案噪声.分析了其产生的原因,提出了一种基于亮度恒定假设和配准的条纹非均匀性校正算法.根据相邻两帧获得亮度均方误差函数,最后通过最小化全局亮度均方误差函数得到全局最优解作为非均匀性校正的参数.实验结果表明,该算法能够在几帧内达到较好的收敛,且计算简单,有效提高了条纹非均匀性的校正效果.

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