Hafez I M,Ghibaudo G, Balestra F, et al. Impact of LDD structures on the operation of silicon MOSFETs at low temperature[J]. Solid-State Electronics, 1995,38:419-424.
[2]
Weidong Liu, Xiaodong Jin, Kanyu. M. Cao. BSIM3v3.3 MOSFET Model User\\' s Manual[M]. University of California, Berkeley, 2005.
[3]
Yoshikawa N, Tomida T, Tokuda M, et al. Characterization of 4K CMOS devices and circuits for hybrid Josephson-CMOS systems [J]. IEEE Transactions on applied supercon-ductivity, 2005,15 : 267-271.
