【1】Lee Jang-Sik, Kang B S, JiaQ X. Data retention characteristics of Bi3. 25La0.75Ti3O12thin films on conductive SrRuO3 electrodes [J].App1. Phys. Lett.,2007,91(142901): 1—3.
[2]
【2】Mantese Joseph V, MicheliAdolph L, Catalan Antonio B, et al.Formation of lanthanum strontium cobalt thin films by metalorganic decomposition[J].Appl. Phys. Lett.,1994, 64(25): 3509—3511.
[3]
【3】JainM, Karan N K, Yoon J,et al.High tunability of lead strontium titanate thin filmsusing a conductiveLaNiO3 as electrodes[J].Appl. Phys. Lett.,2007,91(07):2908—2910.
[4]
【4】WuW B, WongKH, Choy C L,et al.Top-interface-controlled fatigue of epitaxial Pb(Zr0.52Ti0.48)O3ferroelectric thin films on La0.7Sr0.3MnO3electrodes[J].Appl. Phys. Lett.,2000,77(21): 3441—3443.
[5]
【5】WangG S, Hu Z G, Huang Z M,et al.Infrared optical properties ofPbZr0.4Ti0.6O3/La0.5Sr0.5CoO3heterostructures on platinized silicon substrate[J].Appl. Phys. A,2004,78(1): 119—123.
[6]
【6】Chen X, Wu N J, RitumsD L,et al.Pulsed laser deposition of conducting porous La-Sr-Co-O films[J].Thin Solid Films,1999,342(1-2): 61—66.
[7]
【7】Ramesh R, GilchristH, Sands T,et al.Ferroelectric LaSr-Co-O/Pb-Zr-Ti-O/La-Sr-Co-O heterostructures on silicon via template growth[J].Appl. Phys. Lett.,1993,63(26): 3592—3594.
[8]
【8】Cheung JeffreyT, Morgan PeterE D, Lowndes Douglas H, et al.Structural and electrical properties ofLa0.5Sr0.5CoO3 epitaxial films[J].Appl. Phys. Lett.,1993,62(17):2045—2047.
[9]
【9】Azzam R M A, Bashara N M.Ellipsometry and Polarized Light[M].Amsterdam: Elsevier,1977, 181.
[10]
【10】Hu Z G, Huang ZM, WuY N,etal.Ellipsometric characterization of LaNiO3-xfilms grown on Si(111) substrates: Effects of oxygen partial pressure[J].J. Appl. Phys.,2004,95(8): 4036—4041.
[11]
【11】Huang Zhiming, Meng Xiangjian, Yang Pingxiong,et al. Opticalproperties ofPbZrxTi1-xO3on platinized silicon by infrared spectroscopic ellipsometry[J].Appl. Phys. Lett., 2000,76(26): 3980—3982.
[12]
【12】Palik E D.Handbook ofOpticalConstants ofSolids[M]. Orlando:Academic,1985, 341.
