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核技术  2014 

HPGe探测器对圆形面源探测效率的研究

DOI: 10.11889/j.0253-3219.2014.hjs.37.070404, PP. 70404-70404

Keywords: 高纯锗(HighPurityGermanium,HPGe)探测器,圆形面源,探测效率

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Abstract:

实验刻度了GEM60P4型高纯锗(HighPurityGermanium,HPGe)探测器在H=250mm处对三种圆形面源(?24mm、?80mm和?90mm)的峰探测效率，结果表明，这三种源的效率基本一致。采用MCNP模拟了?40–160mm内的圆形面源效率，研究了探测效率随样品直径的变化关系，并采用Geant4计算了圆形面源对同轴探测器的有效立体角。对?90mm以上的样品源，探测效率随源直径的增大在逐渐减小，且高能?射线效率减小程度较快，需采用标准源进行效率刻度。

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