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核技术  2015 

用同步辐射共聚焦X射线方法研究古代彩绘样品的层状结构

DOI: 10.11889/j.0253-3219.2015.hjs.38.060101, PP. 60101-60101

Keywords: 共聚焦微束X射线荧光,共聚焦微束X射线吸收精细结构,深度分辨,三维,斗彩

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Abstract:

同步辐射共聚焦X射线方法是一种元素成分及其化学结构的三维无损分析方法,在地质、考古、环境、生物及材料等领域具有重要的应用。在上海光源的硬X射线微聚焦光束线站(BL15U)建立共聚焦X射线实验方法,并用于故宫彩绘样品的制作工艺及层状结构分析。基于BL15U的K-B聚焦系统,在能散探测器前采用会聚毛细管半透镜实现与K-B聚焦镜焦点的共聚焦状态,深度分辨在8.04keV(Cu-K?)为31.5?m,可以开展共聚焦微束X射线荧光(Micro-X-rayFluorescence,Micro-XRF)和共聚焦微束X射线吸收精细结构(Micro-X-rayAbsorptionFineStructure,Micro-XAFS)实验研究。对故宫斗彩陶瓷和彩绘样品进行了元素及其化学态的深度分布分析,获得了斗彩陶瓷特有的三层釉结构以及彩绘样品内部颜料的化学信息。实验结果表明,该系统具有较高的空间分辨和探测灵敏度,是文物样品三维无损分析的有力工具。

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