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核技术  2015 

劳厄弯晶色散特性的光线追迹研究

DOI: 10.11889/j.0253-3219.2015.hjs.38.040101, PP. 40101-40101

Keywords: X射线光学,劳厄弯晶,色散特性,光线追迹

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Abstract:

劳厄弯晶具有可有效降低高热负载的影响,同时对透射光可以再次利用,已作为高通量密度高能X射线(30keV以上)聚焦、准直和单色化的最有效的分光元件。研究其色散特性,对发展高性能、多用途的劳厄弯晶单色器具有重要意义。采用自行发展的光线追迹软件对劳厄弯晶的色散特性进行了深入研究,得到衍射光能量随光斑的分布情况以及利用单块劳厄弯晶获得可聚焦不同能量射线束的选取方法,并推导了双光束中心能量及带宽的一般公式,为下一步更好地应用劳厄弯晶打下了基础。

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