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材料工程  2015 

Sn-Sb-Cu-Ni焊料和焊点在低温条件下组织和性能研究

DOI: 10.11868/j.issn.1001-4381.2015.11.010, PP. 57-64

Keywords: 无铅焊料,显微组织,低温脆性,纳米压痕测试,低周疲劳

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Abstract:

为保证Sn-Sb-Cu-Ni合金及焊点在低温环境下使用可靠性,将SnSb4.5CuNi合金焊料和焊点在25,-10,-20,-60℃恒温环境中进行储存565天后,考察了不同温度下SnSb4.5CuNi合金微观组织形貌、物相、密度、电导率、抗拉强度和塑性的变化,通过纳米压痕法测量SnSb4.5CuNi/Cu焊点界面过渡层Cu6Sn5金属间化合物(IMC)的硬度和弹性模量,对焊接接头进行抗拉强度、剪切强度和低周疲劳测试。结果表明合金主要由SbSn和β-Sn组成,低温处理565天后合金组织形貌逐渐转变为树枝状组织,焊料合金的密度和电导率均随温度降低而升高,表明经低温储存后合金没有发生灰锡转变,但脆性SbSn相析出量的增多和枝晶组织致使铸态合金的拉伸强度降低,增加了合金脆断风险;随着温度的下降,焊接界面IMC层的弹性模量和硬度增大,焊件拉伸破坏模式从焊料内部转为IMC层,断口越趋平整,焊件的抗拉强度、抗剪强度下降,呈现了低温脆性断裂的倾向。

References

[1]  陈海燕,揭晓华,张海燕,等.添加0.05%(La+Ce)对SnXCuNi焊料与Cu基板间界面组织的影响[J].材料工程, 2011,(9):29-33. CHEN Hai-yan, JIE Xiao-hua, ZHANG Hai-yan,et al. Effects of adding 0.05%(La+Ce) on intermetallic compounds at Sn-X-Cu-Ni/Cu interface[J].Journal of Materials Engineering, 2011,(9):29-33.
[2]  YANG L, JIE X H, GUO L. Low-temperature property of new type lead-free solder Sn-X-Cu-Ni[J].Advanced Materials Research,2011, 154-155:371-375.
[3]  陈海燕,谢羽,余桂达,等.等温时效对SnSb4.5CuNi/Cu焊接接头力学性能的影响[J].电子元件与材料,2015,34(4):69-73. CHEN Hai-yan, XIE Yu, YU Gui-da, et al. Mechanical properties of SnSb4.5CuNi/Cu joints during isothermal aging[J].Electronic Components and Meterials,2015,34(4):69-73.
[4]  侯德龙,宋月清,何德山,等.镧对锌阳极带低温脆性的影响[J].中国稀土学报,2004,22(4):481-483. HOU De-long,SONG Yue-qing,HE De-shan,et al. Effect of lanthanum on low temperature brittleness of zinc anodes ribbon[J]. Journal of the Chinese Rare Earth Society,2004,22(4):481-483.
[5]  ECKERT A. Organ pipes and tin pest[J].Materials and Corrosion, 2008, 59(3):254-260.
[6]  WEI Q P. An investigation of Sn pest in pure Sn and Sn-based solders[J].Microelectronics Reliability, 2009, 49(1):86-91.
[7]  GIALANELLA S,DEFLORIAN F,GIRARDI F,et al. Kinetics and microstructural aspects of the allotropic transition in tin[J].Journal of Alloys and Compounds,2009,474(1):134-138.
[8]  PLUMBRIDEG W J. Tin pest in electronics[J].Circuit World, 2007, 33(1):9-14.
[9]  DI MAIO D, HUNT C P. Monitoring the growth of the α-phase in tin alloys by electrical resistance measurements[J].Journal of Electronic Materials,2009,38(9):1874-1880.
[10]  CHEN J, SHEN J,LAI S Q,et al. Microstructural evolution of intermetallic compounds in Sn3.5Agx(x=0,0.75Ni,1.0Zn and 1.5In)/Cu solder joints during liquid aging[J].Journal of Alloys and Compounds,2010,489:631-637.
[11]  谭孟曦.利用纳米压痕加载曲线计逄硬度-压入深度关系及弹性模量[J].金属学报,2005,41(10):1020-1024. TAN Meng-xi. Extracting hardness-displacement relations and elastic modulus using nanoindentation loading curves[J].Acta Metallurgica Sinica,2005,41(10):1020-1024.
[12]  刁慧,王春青,赵振清,等.SnCu钎料镀层与Cu/Ni镀层钎焊接头的界面反应[J].中国有色金属学报,2007,17(3):410-416. DIAO Hui, WANG Chun-qing, ZHAO Zhen-qing, et al. Interfacial reactions between Sn-Cu solder alloy and Cu/Ni coatings during reflow soldering[J].The Chinese Journal of Nonferrous Metals, 2007, 17(3):410-416.
[13]  IRISAWA A. Lead-free:reduce joint cracks in automotive[J]. SMT-Surface Mount Technology-Tulsa, 2006, 20(6):39-41.
[14]  KIM J M, WOO S W,CHANG Y S,et al.Impact reliability estimation of lead-free solder joint with IMC layer[J].Thin Solid Films,2009,517:4255-4259.
[15]  WU X J, WILLIAMS S, GONG D G. A true-stress creep model based on deformation mechanisms[J].Journal of Material Engineering and Performance, 2012, 21(11):2255-2262.

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