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投影光刻系统中的掩模硅片相关识别对准技术

, PP. 764-768

Keywords: 激光技术,光刻,套刻技术,模式识别,纯相位匹配滤波器

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Abstract:

分析图像相关识别中的纯相位匹配滤波器的模式识别方法,利用该滤波器的相关识别位图计算算法,及其所具有的相干峰尖锐特性与高度旋转敏感特性,分别求取得光刻套刻过程中,掩模板和硅片基板对准标记的相对平移坐标与旋转坐标的精密量化驱动值。将此算法的实施单元建立在一套成型的大面积投影光刻系统中,使得该系统的对位精度与对位效率显著地提高。

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