OALib Journal期刊
X射线吸收精细结构技术在高分子及相关材料中的应用
DOI: 10.3724/SP.J.1105.2014.13303
Keywords: 高分子材料 ,XAFS ,原子结构
Abstract:
高分子材料由于其优异的物理和化学性能应用范围非常广泛，而同步辐射光源的发展大大提高了X射线吸收精细结构（XAFS）技术的使用.本文介绍了XAFS包括扩展X射线吸收精细结构（EXAFS）和X射线吸收近边结构（XANES）的实验原理和实验手段，综述了同行利用XAFS技术在常见高分子、有机金属高分子、钯掺杂高分子、离聚物及碳基材料等高分子领域的结构研究进展，展示了XAFS技术在高分子及其相关材料领域的重要作用和分析方法，体现了XAFS技术的优势和特点，并对XAFS技术在高分子及相关材料方面的应用进行了展望.随着同步辐射技术的发展和提高，XAFS技术在高分子领域的应用将会进一步拓展和提升.
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