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高温下n-GaN/Ti/Al/Ni/Au欧姆接触的可靠性研究

Keywords: 欧姆接触,接触电阻率,可靠性

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Abstract:

研究了高温工作环境下Ti/Al/Ni/Au(15nm/220nm/40nm/50nm)四层复合金属层与n-GaN(N_d=3.7×10~(17)cm~(-3),N_d=3.0×10~(18)cm~(-3))的欧姆接触特性,试验结果标明,当测量温度低于300℃时,存储时间为0~24h,其接触电阻率基本不变,表现出良好的温度可靠性;分别经过300、500℃各24h高温存储后,其欧姆接触发生了较为明显的退化,且不可恢复.接触电阻率均随测量温度的增加而增大,掺杂浓度越高,其接触电阻率随测量温度的升高缓慢增加;重掺杂样品的n-GaN/Ti/Al/Ni/Au欧姆接触具有更高的高温可靠性。

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