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钨电极与氧化锌纳米线接触的电学特性

Keywords: 氧化锌纳米线,I-V特性,欧姆接触,肖特基势垒

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Abstract:

为了研究单根纳米线的电学性能及基于纳米线器件的性能表征,在扫描电镜中采用微操纵仪系统,构成测试单根ZnO纳米线的电流-电压(I-V)曲线的两探针装置.测量得到基本线性、典型整流型、基本对称和非对称的I-V曲线.采用金属-半导体-金属(M-S-M)模型和热电子发射理论分析了I-V曲线的特征.ZnO纳米线的导通电流主要取决于纳米线与2个钨电极的M-S-M结的接触程度.ZnO纳米线电学性能的计算表明,由基本线性I-V特征计算的电阻率为4.2Ω.cm;整流型I-V特性曲线的有效势垒高度为0.47eV.

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