|
OALib Journal期刊
ISSN: 2333-9721
费用：99美元
|
|
|
|
传输线模型分析有机涂层厚度对阻抗谱的影响
, PP. 1205-1209
Keywords: 阻抗谱,传输线,涂层厚度
Abstract:
根据传输线类型的CR电路和结构固定的QR电路之间关系所建立的分析阻抗谱的方法,探讨了有机涂层厚度的不同影响及其应用.CR电路拟合稳定性较高,对于完整涂层,其参数C0随涂层吸水量增加的变化比恒相位角元件参数Y0更有规律,导出参数A1和B1可评价涂层厚度对阻挡性的影响.对于阻挡性不完整的薄涂层,在一定厚度范围内,离散电容Ci随特征频率f*变化的对数曲线斜率与涂层厚度无关,但与离散电容和电阻的相对增量比有确定的关系,可用于评价金属/涂层界面粘结力的变化,并解释了其原因.
| [1] | Cao C N, Zhang J Q. An Introduction to Electrochemical Impedance Spectroscopy, Beijing: Science Press, 2002(曹楚南,张鉴清.电化学阻抗谱导论,北京:科学出版社,2002)
|
| [2] | Hirayamas R, Haruyama S, Corrosion, 1991; 47: 952
|
| [3] | Fedrizzi L, Deflorian F, Bonora P L. Electrochim Acta,1999; 44(24) : 4251
|
| [4] | Deflorian F, Fedrizzi L, Bonora P L. Prog Org Coat, 1993;23: 73
|
| [5] | Pebere N, Picaud T H, Duprat M, Dabosi F. Corros Sci,1989; 29: 1073
|
| [6] | Mansfeld F, Kendig M W, Tsai S. Corrosion, 1982; 38:570
|
| [7] | Grandle J A, Taylor S R. Corrosion, 1997; 53 (5) : 347
|
| [8] | Brasher D M, Kingsbury A H. J Appl Chem, 1954; 4: 62
|
| [9] | Gonzalez S, Gil M A, Hernandez J O, Fox V, Sout R M.Prog Org Coat, 2001; 41: 167
|
| [10] | Sun Q X, Zhang J Q, Lin O J. Acta Phys-Chim Sin, 2004;1: 70(孙秋霞,张鉴清,林昌健.物理化学学报, 2004;1:70)
|
| [11] | Santagtate D M, Rere P R, Eisner C I, Di Sarli A R. ProgOrg Coat, 1998; 33: 44
|
| [12] | Domingues L, Oliveira C, Fernandes J C S, Ferreira M GS. Electrochim Acta, 2002; 47(13-14) : 2253
|
| [13] | Campestrini P, van Westing E P M,de Wit J H W. Electrochim Acta, 2001; 46: 2631
|
| [14] | Jimenez-Morales A, Galvan J C, Aranda P A. ElectrochimActa, 2002; 47: 2281
|
| [15] | Liu B, Li Y, Lin H C, Cao C N. Corros Sci, 2002; 44:2657
|
| [16] | Deflorian F, Fedrizzi L, Rossi S. Corrosion, 1999; 55: 1003
|
| [17] | Deflorian F, Fedrizzi L. J Adhesion Sci Technol, 1999;13(5) : 629
|
| [18] | van Westing E P M, Ferrari G M, de Wit J H. Corros Sci,1994; 36(6) : 957
|
| [19] | Kendig M W. Corrosion, 1999; 55: 222
|
| [20] | Miskovic-Stankovic V B, Drazic D M, Kacarevic-PopovicZ. Corros Sci, 1996; 38: 1513
|
| [21] | Shigeyoshi M, Prog Org Coat, 1996; 28: 227
|
| [22] | Fedrizzi L, Rodriguez F J, Rossi S, Deflorian F, Di MaggioR. Electrochim Acta, 2001; 46: 3715
|
Full-Text
|
|
Contact Us
service@oalib.com QQ:3279437679 
WhatsApp +8615387084133
|
|
