1 Booker, G. R., Scanning Electron Microscopy, 1971, Proc. of 4th Annual SEM Symposium, Eds. Johari, O.; Corrin, Ⅰ., ⅡT Res. Inst., Chicago, Illinois, USA, 1971, p. 467．
[2]
2 Stickler, R.; Hughes, C. W., ibid., p. 473．
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3 Joy, D. C.; Newbury, D. E.; Hazzledine, P. M., Scanning Electron Microscopy, 1972, Proc. of 5th Annual SEM Symposium, Eds. Johari, O.; Corrin, Ⅰ., ⅡT Res. Inst., Chicago, Illionis, USA, 1972, p. 97．
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4 Hirsch, P. B.; Humphreys, C. J., Scanning Electron Microscopy, 1969, Proc. of 2nd Annual SEM Symposium, Eds. Johari, O; Corrin, Ⅰ., ⅡT Res. Inst., Chicago, Illinois. USA, 1969, p. 451．
