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金属学报  2004 

双相材料中相间内应力的X射线测量与表征

, PP. 351-354

Keywords: 双相材料,相间内应力,X射线应力测量

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Abstract:

基于X射线应力测量原理,建立了一种双相材料相间内应力的测量与表征方法.利用衍射谱线上两相的衍射峰位差,有效地消除了仪器的系统误差.测量了实际材料SiCp/6061Al中的相间内应力,证实该方法具有较高的测量精度.

References

[1]  Noyan I C, Cohen J B. Residual Stress Measurement by Diffraction and Interpretation, Springer-Verlag Press, 1989: 54
[2]  Zhang D Q, He J W. Residual Stress Analysis by X-ray Diffraction and Its Functions, Xi'an: Xi'an Jiaotong University Press, 1999: 3(张定铨,何家文.残余应力的X射线分析与作用,西安:西安 交通大学出版社, 1999:3)
[3]  Ledbetter H M, Austin M W. Mater Sci Eng, 1987; 89:53
[4]  Sun Z M, Li J B, Wang Z G, Li W J. Acta Metall Mater,1992; 40(11) : 2961
[5]  Sun Z M, Li J B, Wang Z G, Lu S X. Physical Testing andChemical Analysis Part A, Physical Testing, 1992; 28(2) ;38(孙正明,李家宝,王中光,吕毓雄.理化检验物理分册. 1992;28(2) :38)
[6]  Taya M, Arsenault R J. Metal Matrix Composites Ther-moraechanical Behavior. Pergamon Press, 1989: 23
[7]  Jiang C H, Wang D Z, Yao Z K. Acta Metall Sin, 2000; 36: 555(姜传海,王德尊,姚忠凯.金属学报, 2000;36:555)
[8]  Jiang C H, Wang D Z, Yao C K, J Mater Sci Lett, 1999;18: 901
[9]  Yang Y X, Qi X. Analysis by X-ray Diffraction, Shanghai:Shanghai Jiaotong University Press, 1994: 140(杨于兴,漆 玄. X射线衍射分析,上海:上海交通大学出版社, 1994:140)

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