OALib Journal期刊
ISSN: 2333-9721
费用:99美元
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固液界面纳米气泡研究
, PP. 1447-1455
Keywords: 纳米气泡,固液界面,稳定性
Abstract:
固液界面纳米气泡是近十年来表面科学的重要发现之一。从利用原子力显微镜(AFM)在固液界面上观察到纳米气泡以来,科学工作者们已经证实了纳米气泡在固液界面上存在。由于其在微机电系统(MEMS)、微生化系统、表面科学、流体动力学等领域潜在的应用价值,各国学者们对纳米气泡的自身性质及影响因素已经开展了多方面的研究。但纳米气泡稳定性(反常的长寿)的原因仍然是未解决的问题之一。本文综述了纳米气泡的形成及影响因素,重点评述了纳米气泡稳定性理论,包括线张力理论、动态平衡理论、杂质理论和克努森气体理论等。同时,介绍了固液界面纳米气泡的应用,并展望了未来研究的重点和方向。
References
[1] | Lou S T, Ouyang Z Q, Zhang Y, Li X J, Hu J, Li M Q, Yang F J. J. Vac. Sci. Technol. B, 2000, 18, 2573-2575
|
[2] | Borkent B M, de Beer S S, Mugele F, Lohse D. Langmuir, 2010, 26(1): 260-268
|
[3] | Zhang X H, Maeda N, Craig V S J. Langmuir, 2006, 22(11): 5025-5035
|
[4] | Zhang L, Zhang Y, Zhang X, Li Z, Shen G, Ye M, Fan C, Fang H, Hu J. Langmuir, 2006, 22(19): 8109-8113
|
[5] | Borkent B M, Schonherr H, Caer G L, Dollet B, Lohse D. Phys. Rev. E, 2009, 80: art. no. 036315
|
[6] | Wu Z H, Zhang X H, Zhang X D, Sun J L, Dong Y M, Hu J. Chin. Sci. Bull., 2007, 52(14): 1913-1919
|
[7] | Tao Y J, Liu J T, Yu S, Tao D. Separation Science and Technology, 2006, 41(16): 3597-3607
|
[8] | Zhou Z A, Chow R S, Cleyle P, Xu Z H, Masliyah J H. Canadian Metallurgical Quarterly, 2010, 49: 363-372
|
[9] | Zhou Z A, Xu Z H, Finch J A, Masliyah J H, Chow R S. Miner. Eng., 2009, 22(5): 419-433
|
[10] | Wang Y L, Bhushan B, Zhao X. Langmuir, 2009, 25(16): 9328-9336
|
[11] | Holmberg M, Kuhle A, Garnaes J, Morch K A, Boisen A. Langmuir, 2003, 19(25): 10510-10513
|
[12] | Zhang X H, Li G, Wu Z H, Zhang X D, Hu J. Chin. Phys., 2005, 14(9): 1774-1778
|
[13] | Borkent B M, Dammer S M, Schonherr H, Vancso G J, Lohse D. Phys. Rev. Lett., 2007, 98: art. no. 204502
|
[14] | Zhang X H, Khan A, Ducker W A. Phys. Rev. Lett., 2007, 98: art. no. 136101
|
[15] | Yang S, Tsai P, Kooij E S, Prosperetti A, Zandvliet H J W, Lohse D. Langmuir, 2009, 25(3): 1466-1474
|
[16] | De Gennes P G. Langmuir, 2002, 18(9): 3413-3414
|
[17] | 张立娟(Zhang L J). 中国科学院上海应用物理研究所博士学位论文(Doctoral Dissertation of Shanghai Institute of Applied Physics, Chinese Academy of Sciences), 2007
|
[18] | Bazant M Z, Vinogradova O I. J. Fluid Mech., 2008, 613: 125-134
|
[19] | Steinberger A, Cottin-Bizonne C, Kleimann P, Charlaix E. Nat. Mater., 2007, 6: 665-668
|
[20] | Yang J, Duan J, Fornasiero D, Ralston J. J. Phys. Chem. B, 2003, 107(25): 6139-6147
|
[21] | Kameda N, Nakabayashi S. Jpn. J. Appl. Phys., 2008, 47(2): 1065-1067
|
[22] | Zhang X H, Maeda N, Craig V S J. Langmuir, 2006, 22 (11): 5025-5035
|
[23] | Jin F, Li J F, Ye X D, Wu C. J. Phys. Chem. B, 2007, 111(40): 11745-11749
|
[24] | Seddon J R T, Zandvliet H J W, Lohse D. Physical Review Letters, 2011, 107(11): art. no. 116101
|
[25] | Drelich J, Miller J D. Colloids and Surfaces, 1992, 69(1): 35-43
|
[26] | Boruvka L, Neumann A W. J. Chem. Phys., 1977, 66(12): 5464-5482
|
[27] | Jensen M O, Mouritsen O G, Peters G H. J. Chem. Phys., 2004, 120(20): 9729-9744
|
[28] | Mamatkulov S I, Khabibullaev P K, Netz R R. Langmuir, 2004, 20(11): 4756-4763
|
[29] | Dammer S, Lohse D. Phys. Rev. Lett., 2006, 96(20): art. no. 206101
|
[30] | Bratko D, Luzar A. Langmuir, 2008, 24(4): 1247-1253
|
[31] | Leung K, Luzar A, Bratko D. Phys. Rev. Lett., 2003, 90(6): art. no. 065502
|
[32] | Checco A, Schollmeyer H, Daillant J, Guenoun P, Boukherroub E. Langmuir, 2006, 22(1): 116-126
|
[33] | Kameda N, Nakabayashi S. Surface Sci., 2008, 602(8): 1579-1584
|
[34] | Das S, Snoeijer J H, Lohse D. Phys. Rev. E, 2010, 82(5): art. no. 056310
|
[35] | 张立娟(Zhang L J), 陈浩(Chen H), 李朝霞(Li Z X), 方海平(Fang H P), 胡钧(Hu J). 中国科学G辑(Science in China Series G), 2007, 37(4): 556-560
|
[36] | Darwich S, Mougin K, Vidal L, Gnecco E, Haidara H. Nanoscale, 2011, 3: 1211-1217
|
[37] | Parker J L, Claesson P M, Attard P. J. Phys. Chem., 1994, 98: 8468-8480
|
[38] | Ishida N, Inoue T, Miyahara M, Higashitani K. Langmuir, 2000, 16: 6377-6380
|
[39] | Hampton M A, Nguyen A V. Advances in Colloid and Science, 2010, 154: 30-55
|
[40] | 张雪花(Zhang X H), 胡钧(Hu J). 化学进展(Progress in Chemistry), 2004, 16 (5): 673-681
|
[41] | Seddon J R T, Lohse D. J. Phys. Condensed Matter, 2011, 23(13): art. no. 133001
|
[42] | Seddon J R T, Kooij E S, Poelsema B, Zandvliet H J W, Lohse D. Physical Review Letters, 2011, 106(5): art. no. 056101
|
[43] | Ducker W A. Langmuir, 2009, 25(16): 8907-8910
|
[44] | Zhang X H, Li G, Maeda N, Hu J. Langmuir, 2006, 22(22): 9238-9243
|
[45] | Zhang L, Zhang X, Fan C, Zhang Y, Hu J. Langmuir, 2009, 25(16): 8860-8864
|
[46] | Hampton M A, Nguyen A V. Miner. Eng., 2009, 22: 786-792
|
[47] | 吴志华(Wu Z H), 张雪花(Zhang X H), 张晓东(Zhang X D), 孙洁林(Sun J L), 董亚明(Dong Y M), 胡钧(Hu J). 科学通报(Chinese Science Bulletin), 2007, 52(6): 629-634
|
[48] | Wang Y L, Bhushan B. Soft Matter, 2010, 6: 29-66
|
[49] | Yang J W, Duan J M, Fornasier D, Ralston J. Journal of Physical Chemistry B, 2003, 107(25): 6139-6147
|
[50] | Li Z X, Zhang X H, Zhang L J, Zeng X C, Hu J, Fang H P. J. Phys. Chem. B, 2007, 111(31): 9325-9329
|
[51] | Wang C L, Li Z X, Li J Y, Xiu P, Hu J, Fang H P. Chinese Physics B, 2008, 17(7): 2646-2654
|
[52] | Yang S, Dammer S M, Bremond N, Zandvliet H J W, Kooij E S, Lohse D. Langmuir, 2007, 23(13): 7072-7077
|
[53] | Zhang X H, Zhang X D, Lou S T, Zhang Z X, Sun J L, Hu J. Langmuir, 2004, 20(9): 3813-3185
|
[54] | Yang S, Kooij E S, Poelsema B, Lohse D, Zandvliet H J W. Euro. Physics Letters, 2008, 81: art. no. 64006
|
[55] | Brenner M P, Lohse D. Phys. Rev. Lett., 2008, 101(21): art. no. 214505
|
[56] | Kunert C, Harting J, Vinogradova O I. Phys. Rev. Lett., 2010, 105: art. no. 016001
|
[57] | Van Limbeek M A J, Seddon J R T. Langmuir, 2011, 27: 8694-8699
|
[58] | Zhang X H, Quinn A, Ducker W A. Langmuir, 2008, 24(9): 4756-4764
|
[59] | Mugele F, Becker T, Nikopoulos R, Kohonen M, Herminghaus S. Journal of Adhesion Science and Technology, 2002, 16(7): 951-964
|
[60] | Grigera J R, Kalko S G, Fischbarg J. Langmuir, 1996, 12(1): 154-158
|
[61] | Luzar A, Bratko D. J. Phys. Chem. B, 2005, 109(47): 22545-22552
|
[62] | Ball P. Nature, 2003, 423(6935): 25-26
|
[63] | Das S. Phys. Rev. E, 2011, 83: art. no. 066315
|
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