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基于等温表面电位衰减法的直流电缆用低密度聚乙烯和交联聚乙烯陷阱电荷分布特性

DOI: 10.13336/j.1003-6520.hve.2015.08.021, PP. 2689-2696

Keywords: 低密度聚乙烯,交联聚乙烯,直流电缆,陷阱电荷,等温表面电位衰减,ISPD,陷阱

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Abstract:

空间电荷积聚是影响直流电缆安全运行的重要原因,定量表征直流电缆用聚乙烯材料内陷阱电荷的分布特性并分析其内部陷阱产生的根源,对抑制空间电荷积聚、加强直流电缆安全可靠运行具有重要意义。为此,采用直流电晕充电法对低密度聚乙烯(low-densitypolyethylene,LDPE)和交联聚乙烯(crosslinkedpolyethylene,XLPE)薄膜试样进行了充电,以模拟直流加压时电荷的注入过程。通过考虑材料内入陷电荷的出陷规律,建立了1个等温表面电位衰减(isothermalsurfacepotentialdecay,ISPD)模型。通过分析LDPE和XLPE薄膜试样的ISPD数据,获得了其内部陷阱电荷的分布特性,并进一步分析了LDPE与XLPE形态学特性和添加剂对陷阱形成的影响。结果表明LDPE和XLPE中分别存在2个陷阱中心,即浅陷阱中心和深陷阱中心;LDPE中与XLPE中空穴深陷阱电荷密度都高于空穴浅陷阱电荷,即2者空穴陷阱电荷主要以深陷阱为主;XLPE中空穴浅陷阱电荷与空穴深陷阱电荷之间的数量差距减少,XLPE中空穴浅陷阱高于LDPE中空穴浅陷阱。交联副产物对XLPE内部陷阱的形成产生重要影响,且添加剂形成的空穴类型陷阱的深度并不完全相同。

References

[1]  周远翔,赵健康,刘 睿,等. 高压/超高压电力电缆关键技术分析及展望[J]. 高电压技术,2014,40(9):2593-2612. ZHOU Yuanxiang, ZHAO Jiankang, LIU Rui, et al . Key technical analysis and prospect of high voltage and extra-high voltage power cable[J]. High Voltage Engineering, 2014, 40(9): 2593-2612.
[2]  陈 曦,吴 锴,王 霞,等. 纳米粒子改性聚乙烯直流电缆绝缘材料研究(Ⅰ)[J]. 高电压技术,2012,38(10):2691-2697. CHEN Xi, WU Kai, WANG Xia, et al . Modified low density polyethylene by Nano-fills as insulating material of DC cable(Ⅰ)[J]. High Voltage Engineering, 2012, 38(10): 2691-2697.
[3]  马为民,吴方劼,杨一鸣,等. 柔性直流输电技术的现状及应用前景分析[J]. 高电压技术,2014,40(8):2429-2439. MA Weimin, WU Fangjie, YANG Yiming , et al . Flexible HVDC transmission technology’s today and tomorrow[J]. High Voltage Engineering, 2014, 40(8): 2429-2439.
[4]  王 立,杜伯学,任志刚,等. 高压交联聚乙烯电缆绝缘劣化试验分析[J]. 高电压技术,2014,40(1):111-116. WANG Li, DU Boxue, REN Zhigang, et al . Test and analysis of insulation deterioration of XLPE power cable[J]. High Voltage Engineering, 2014, 40(1): 111-116.
[5]  王雅群. 高压直流塑料电缆中空间电荷抑制方法研究[D]. 上海:上海交通大学,2009. WANG Yaqun. Research on the suppression method of space charge in high voltage direct current plastic insulated cables[D]. Shanghai, China: Shanghai Jiao Tong University, 2009.
[6]  Zhang Y W, Lewiner J, Alquie C, et al . Evidence of strong correlation between space-charge buildup and breakdown in cable insulation[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 1996, 3(6): 778-783.
[7]  Shen W W, Mu H B, Zhang G J, et al . Identification of electron and hole trap based on isothermal surface potential decay model[J]. Journal of Applied Physics, 2013, 113: 083706.
[8]  Suh K S, Koo J H, Lee S H, et al . Effects of sample preparation conditions and short chains on space charge formation in LDPE[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 1996, 3(2): 153-160.
[9]  Chen Y, Cheng Y H, Wu K, et al . Flashover characteristic of epoxy composites filled with different micro-Inorganic oxide particles under nanosecond pulse in vacuum[J]. IEEE Transactions on Plasma Science, 2009, 37(1): 195-203.
[10]  Min D M, Cho M, Khan A R, et al . Surface and volume charge transport properties of polyimide revealed by surface potential decay with genetic algorithm[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2012, 19(2): 600-608.
[11]  Min D M, Cho M, Li S T, et al . Charge transport properties of insulators revealed by surface potential decay experiment and bipolar charge transport model with genetic algorithm[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2012, 19(6): 2206-2215.
[12]  Chen G, Xu Z, Zhang L W. Measurement of the surface potential decay of corona-charged polymer films using the pulsed electroacoustic method[J]. Measurement Science and Technology, 2007, 18: 1453-1458.
[13]  高 宇,杜伯学. 采用表面电位衰减法表征高压交联聚乙烯电缆绝缘中空间电荷的输运特性[J]. 高电压技术,2012,38(8):2097-2103. GAO Yu, DU Boxue. Characterizing space charge transportation in HV XLPE cable insulation based on surface potential decay measurment[J]. High Voltage Engineering, 2012, 38(8): 2097-2103.
[14]  Molinie P. A review of mechanisms and models accounting for surface potential decay[J]. IEEE Transactions on Plasma Science, 2009, 40(2): 167-176.
[15]  Williams C K. Kinetics of trapping, detrapping, and trap generation[J]. Journal of Electronic Materials, 1992, 21(7): 711-720.
[16]  Dissado L A, Fothergill J C. Electrical degradation and breakdown in polymers[M]. London, UK: Peter Peregrinus Ltd Press, 1992: 207-227.
[17]  Jones J P, Llewellyn J P, Lewis T J. The contribution of field-Induced morphological change to the electrical aging and breakdown of polyethylene[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2005, 12(5): 951-966.
[18]  Meunier M, Quirke N. Electrical degradation and breakdown in polymers[M]. London, UK: Peter Peregrinus Ltd Press, 1992: 207-227.
[19]  Righi M C, Scandolo S, Serra S, et al . Surface states and negative electron affinity in polyethylene[J]. Physical Review Letters, 2001, 87(7): 076802.
[20]  Serra S, Tosatti E, Iarlori S, et al . Interchain electron states in polyethylene[J]. Physical Review B, 2000, 62(7): 4389-4393.
[21]  张冶文,赵 晖,李宗泽,等. 聚乙烯与聚丙烯中空间电荷注入特性的比较[J]. 高电压技术,2014,40(9):2613-2618. ZHANG Yewen, ZHAO Hui, LI Zongze, et al . Comparison of space charge injection behaviors between Polythene and Polypropylene[J]. High Voltage Engineering, 2014, 40(9): 2613-2618.
[22]  李 剑,沈 健,杨丽君,等. 冷却介质对低密度聚乙烯空间电荷输运特性的影响[J]. 高电压技术,2010,36(11):2629-2633. LI Jian, SHEN Jian, YANG Lijun, et al . Influence of cooling medium on space charge transport property of LDPE[J]. High Voltage Engineering, 2010, 36(11): 2629-2633.
[23]  Andrews T, Hampton R N, Smedberg A, et al . The role of degassing in XLPE power cable manufacture[J]. IEEE Electrical Insulation Magazine, 2002, 22(6): 5 -16.
[24]  Teyssedre G, Laurent C. Charge transport modeling in insulating polymers: from molecular to macroscopic scale[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2005, 12(5): 857-875.
[25]  Teyssedre G, Laurent C, Quirke N, et al . Deep trapping centers in crosslinked polyethylene investigated by molecular modeling and luminescence techniques[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2001, 8(5): 744-752.

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