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结构单元表面电导率测量系统及应用

DOI: 10.13336/j.1003-6520.hve.2015.08.035, PP. 2803-2809

Keywords: 绝缘子,污秽度,结构单元,表面电导率,测量系统,等价性

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Abstract:

表面电导率涵盖了污秽成分、污层受潮以及污秽在表面的分布状况等全面信息,是较为理想的污秽度评估参数。为此,提出了1种新的表面电导率测量方法即结构单元表面电导率测量方法,并设计了完整的结构单元表面电导率测量系统。该系统的试验仓温湿度可控,能够精确测量泄漏电流值并实时存储,还可计算绝缘子的结构单元表面电导率。实验室的人工污秽试验结果表明绝缘子结构单元表面电导率与闪络电压有较好的负幂指数关系,自然污秽试验结果同样满足该关系。应用所开发的系统开展了现场污秽度测量,结果表明该系统可方便快捷测定结构单元表面电导率,其预测的闪络电压与实测闪络电压误差较小。

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