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表面粗糙度对有机玻璃材料真空沿面闪络特性的影响

DOI: 10.13336/j.1003-6520.hve.2015.02.017, PP. 474-478

Keywords: 真空,闪络电压,有机玻璃,表面粗糙度,打磨方向,博弈模型

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Abstract:

目前国内外关于绝缘材料的表面粗糙度对其真空中沿面闪络特性的影响尚无定论。为此以有机玻璃材料为研究对象,采用不同目数的砂纸制备不同表面粗糙度的样品,并进行了真空沿面闪络实验研究。结果表明随着表面粗糙度的增加,有机玻璃的闪络电压呈现U型变化规律,即先减小后增大的变化趋势。同时,研究了打磨方向对有机玻璃闪络特性的影响。在粗糙度较大的情况下,合适的打磨方向可以明显提高闪络电压,尤其是垂直于电极方向打磨时,材料表现出闪络电压高、分散性小的特点;但在粗糙度较小的范围内,闪络特性受打磨方向的影响不明显,甚至有略微下降的趋势。结合实验结果,基于二次电子发射雪崩理论,从宏观和微观2个角度讨论了粗糙度对于绝缘材料闪络特性的影响机理,提出了表面粗糙度对于闪络影响的博弈模型。

References

[1]  Blaise G, Legressus C. Charging and flashover induced by surface polarization relaxation process[J]. Journal of Applied Physics, 1991, 69(9): 6334-6339.
[2]  Le Gressus C, Blaise G. Breakdown phenomena related to trapping/detrapping processes in wide band gap insulators[J]. IEEE Transactions on Electrical Insulation, 1992, 27(3): 472-481.
[3]  Bugaev S P, Iskoldskii A M, Mesyats G A. Investigation of the pulsed breakdown mechanism at the surface of a dielectric in a vacuum I. uniform field[J]. Soviet Physics-Technical Physics, 1968, 12(10): 1358-1362.
[4]  Le Gressus C, Blaise G. Charging and discharging phenomena in oxides, electrical and mechanical applications[C]∥Proceedings of the 3 rd International Conference on Properties and Applications of Dielectric Materials. Tokyo, Japan: IEEE, 1991: 812-815.
[5]  Gong H, Ong C K, Legressus C. New observation of trapped charge transportation on circularly bound polymethylmethacrylate surface[J]. Applied Physics Letters, 1995, 67(15): 2243-2245.
[6]  Wetzer J M, Wouters P A A F. HV design of vacuum components[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 1995, 2(2): 202-209.
[7]  Ohki Y, Yahigi K. Temperature dependence of surface flashover voltage of polyethylene in vacuum[J]. Journal of Applied Physics, 1975, 46(8): 3695-3696.
[8]  Cross J D, Srivastava K D, Mazurek B, et al. Surface flashover of ceramic insulation in vacuum at room and liquid nitrogen temperatures[J]. Canadian Electrical Engineering Journal, 1982, 7(4): 19-22.
[9]  Hegeler F, Krompholz G, Hatfield L L, et al. Dielectric surface flashover in a simulated low earth orbit environment[J]. IEEE Transactions on Plasma Science, 1997, 25(2): 300-305.
[10]  李盛涛,黄奇峰. 多层有机绝缘结构真空沿面闪络特性和机理研究[J]. 高电压技术,2013,39(8):1821-1829. LI Shengtao, HUANG Qifeng. Investigation of multilayer organic insulation structure on surface flashover properties and mechanism in vacuum[J]. High Voltage Engineering, 2013, 39(8): 1821-1829.
[11]  张振军,苗 军,王学强,等. 真空、直流电压的电子辐射环境中聚酰亚胺材料的沿面闪络特性[J]. 高电压技术,2014,40(1):117-123. ZHANG Zhenjun, MIAO Jun, WANG Xueqiang, et al . Surface flashover characteristics of polyimide during electron beam irradiation under DC voltage in vacuum[J]. High Voltage Engineering, 2014, 40(1): 117-123.
[12]  肖 立,王 珏,严 萍. 真空沿面放电数值模拟中的通用抽样方法[J]. 高电压技术,2012,38(4):947-955. XIAO Li, WANG Jue, YAN Ping. Universal sampling method in simulation of surface discharge in vacuum[J]. High Voltage Engineering, 2012, 38(4): 947-955.
[13]  丁立建. 真空中绝缘子沿面预闪络与闪络现象的研究[D]. 北京:华北电力大学,2001:10. DING Lijian. Study on the surface pre-flashover and flashover of insulators in vacuum[D]. Beijing, China: North China Electric Power University, 2001: 10.
[14]  Yamamoto O, Takuma T, Fukuda M, et al . Improving withstand voltage by roughening the surface[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 2003, 10(4): 550-556.
[15]  Anderson R A, Brainard J P. Mechanism of pulsed surface flashover involving electron-stimulated desorption[J]. Journal of Applied Physics, 1980, 51 (3): 1414-1421.
[16]  Boersch H, Hamisch H, Ehrlich W. Surface discharges across insulators in vacuum[J]. Zeitschrift für Angewandte Mathematik und Physik, 1963, 15(6): 518-525.
[17]  De Tourreil C H, Srivastava K D. Mechanism of surface charging of high-voltage insulators in vacuum[J]. IEEE Transactions on Electrical Insulation, 1973, 8(1): 17-21.
[18]  Neuber A, Butcher M, Hatfield L L, et al . Electric current in DC surface flashover in vacuum[J]. Journal of Applied Physics, 1999, 85(5): 3084-3091.

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