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直流高压下GIS支柱绝缘子表面电荷积聚特性

DOI: 10.13336/j.1003-6520.hve.2015.09.035, PP. 3073-3081

Keywords: 绝缘子,表面电荷,积聚,反演计算,法向场强分量,气体侧传导

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Abstract:

支柱绝缘子表面的电荷积聚问题是影响直流气体绝缘设备安全运行的重要因素。为了获取直流高压下GIS支柱绝缘子表面电荷的积聚特性,采用静电探头法对直流电压作用一段时间后的两种不同形状绝缘子进行了表面电位的测量,并基于测得的表面电位利用Comsol仿真软件进行了表面电荷的反演计算,得到了绝缘子在不同加压时间、幅值、极性的直流高压下的表面电荷分布特性,结合现存的3种表面电荷积聚机理对实验结果进行了初步的探讨和分析。研究表明加压时间、幅值的增长会促进绝缘子表面电荷的积聚,电压极性的改变会影响绝缘子表面电荷的分布,绝缘子表面的法向场强分量是绝缘子表面电荷积聚的根本原因,自由电荷通过气体侧传导的方式是绝缘子表面电荷积聚的主要途径,表面传导对电荷积聚也能起到一定的作用。

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