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自然污秽成分NaNO3和NaCl对复合绝缘子闪络特性的影响比较

DOI: 10.13336/j.1003-6520.hve.2015.09.028, PP. 3029-3035

Keywords: 复合绝缘子,硝酸钠,氯化钠,闪络特性,电导率,等值盐密

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Abstract:

绝缘子在自然环境下所积的污秽成分多种多样,而不同的污秽成分对绝缘子的闪络特性有影响。NO3-在绝缘子自然污秽成分中的质量分数为10%~40%,为此以35kV复合绝缘子FXBW-35/100为研究对象,试验研究了NaNO3和NaCl对复合绝缘子的闪络特性的影响。通过测量绝缘子的闪络电压、临界泄漏电流以及两种污液的电导率,分析了NaNO3和NaCl对复合绝缘子闪络特性的影响差异。研究结果表明以NaNO3为污秽成分进行闪络试验,闪络电压与盐密的关系仍然满足幂函数关系。通过测电导率计算等值盐密的传统方法和闪络试验得到的结果相差很大。在进行绝缘子自然积污研究时,不能仅通过测量污秽物的电导率来确定其等值盐密,并表征绝缘子的污秽程度或进行污秽等级划分,必须综合考虑不同污秽成分的其他特性,如物理化学特性、离子之间的相互作用、对电弧发展过程的影响等。

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