余小玲,魏义江,刘志远,等. 高电压真空断路器温升影响因素的仿真研究[J]. 高压电器,2007,43(3):179-182. YU Xiaoling,WEI Yijiang,LIU Zhiyuan,et al. Simulation researches on influence factors of temperature rise in high voltage vacuum circuit breaker[J]. High Voltage Apparatus,2007,43(3):179-182.
[3]
PAULKE J,WEICHERT H,STEINHAUSER P. Temperature-rise simulation of switchgear[C]//Proceedings of the Forty-seventh IEEE Holm Conference on Electrical Contacts.[S.l.]:IEEE,2001:6-11.
[4]
FREI P U,WEICHERT H O. Advanced temperature-rise simulation of a circuit breaker[C]//Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts. [S.l.]:IEEE,2004:104-110.
[5]
REN W,LIANG H,ZHAI G. Temperature-rise analysis of hermetically sealed electromagnetic relay in high and low temperature condition[C]//Proceedings of the Fifty-second IEEE Holm Conference on Electrical Contacts. [S.l.]:IEEE,2006:110-116.
[6]
谢 亮. 运行中高压开关柜实际温升分析[J]. 电力安全技术,2005,7(10):10-11. XIE Liang. Analysis of the temperature-rise for the HV switchgear in actual operation[J]. Electric Safety Technology,2005,7(10):10-11.
[7]
周慧东,晁志刚. 减少高压开关温升的措施[J]. 电气制造,2009(10):68-69. ZHOU Huidong,CHAO Zhigang. Measures to reduce the temperature rise of high-voltage switchgear[J]. Electrical Manufacturing,2009(10): 68-69.
[8]
彭贵清. 浅谈高压开关设备的温升及制造技术[J]. 电工技术杂志,2004,7(7):59-62. PENG Guiqing. A study of temperature rise and manufacturing technologies for high voltage switchgears[J]. Electrotechnical Journal,2004,7(7):59-62.
[9]
GB/T 11022―2011 高压开关设备和控制设备的共用技术要求[S]. 2011.
[10]
周会高,杨陶莉,赵端庆,等. 浅议高压开关设备的温升和机械试验[J]. 高压电器,2002,38(5):60-61. ZHOU Huigao,YANG Taoli,ZHAO Duanqing,et al. Elementary introduction to the temperature-rise test and the mechanical test of HV switchgear[J]. High Voltage Apparatus, 2002,38(5):60-61.
[11]
贾一凡,王 博,陆 瑶,等. 开关柜温升试验方法研究[J]. 高压电器,2013,49(8):87-91. JIA Yifan,WANG Bo,LU Yao,et al. Research on temperature-rise test method of switchgear[J]. High Voltage Apparatus,2013,49(8):87-91.
[12]
刘爱华. 浅谈高开断大电流柜温升试验[J]. 江苏电器,2002(1):39-41. LIU Aihua. Brief introduction of temperature-rise tests of the high breaking and heavy current cabinet[J]. Jiangsu Electrical Apparatus,2002(1):39-41.
[13]
喻劲松. 温升试验装置的设计与实现[D]. 武汉:武汉大学,2004. YU Jinsong. Design and realization of temperature-change equioment[D]. Wuhan: Wuhan University,2004.
[14]
赵焕敏,姚永其. 高压开关温升试验方法浅谈[J]. 科技视界,2012,27(9):237-238. ZHAO Huanmin,YAO Yongqi. On temperature-rise test met -hod of HV switchgear[J]. Science & Technology Vision,2012,27(9):237-238.