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光路失效分析的检测方法研究

Keywords: 激光技术,自检(BIT)系统,双向色膜,双光纤探测器,损耗

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Abstract:

为提高激光点火的可靠性,检测光路中存在光纤的弯曲、端面污染、划痕或烧蚀等失效因素造成的损耗,经过双向色膜和双光纤探测器的结构设计,建立了一套双光纤、双光源的自检系统,使检测光的接收率达到6%以上.实验结果表明,获得的光纤损耗在650nm检测光和808nm发火光下损耗半经验公式,从检测光路损耗能推导出发火光路损耗,解决了激光点火技术在工程实际应用中自检测难题.

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