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高速远紫外光子计数成像读出电路设计

DOI: 10.11728/cjss2015.01.110, PP. 110-115

Keywords: 远紫外,单光子成像,楔条形阳极,计数率

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Abstract:

远紫外光子计数成像探测技术通过探测微弱的单光子信息,记录每个单光子位置,在一定时间累积之后达到总体成像的目的.单光子的计数率限制着信息的获取,在分析影响计数率因素的基础上,需要设计前端模拟电路对探测器信号进行放大和整形,具体实现采用A225芯片作为前置放大器,并设计相应的整形电路.仿真和实验结果表明,电路设计合理,计数率可达到200kHz.

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