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基于紫外图像相对光斑面积的绝缘子表面放电量化评估方法研究

DOI: 10.16188/j.isa.1003-8337.2015.03.001, PP. 1-4

Keywords: 绝缘子,表面放电,紫外检测,相对光斑面积

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Abstract:

绝缘子在运行过程中会由于表面污秽、凝露等发生表面放电,紫外成像技术作为一种绝缘子表面放电非接触式检测方法,可对绝缘子表面放电进行有效检测。常用的紫外成像光子数、光斑面积等参数会随着检测距离的变化而变化,无法实现不同检测距离时对绝缘子表面放电紫外检测的统一量化描述。基于紫外图像处理算法,研究了紫外图像相对光斑面积的计算方法,通过不同检测距离下复合绝缘子和玻璃绝缘子的紫外成像检测,验证了相对光斑面积这一参数基本不随检测距离的变化而变化,可有效实现绝缘子表面放电的量化评估。

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