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图像扭曲变换中高斯基函数的最优参数分析

DOI: 10.11834/jig.20090222

Keywords: 图像配准,紧支撑,弹性扭曲,标志点

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Abstract:

薄板样条插值TPS是基于标记点的医学图像弹性配准中常用的插值方法,但该方法的扭曲作用是全局的,对于局部扭曲配准会导致匹配精度下降。基于径向基函数的图像变换方法可以解决局部扭曲配准问题,但如何选取径向基函数的参数还没有很好地解决。本文针对以高斯基函数为径向基函数的局部弹性变换问题,讨论了双标志点情况下高斯径向基函数的参数选取方法,该方法可以使双标志点之间的扭曲影响范围最局部化。本文结论用于多标志点的图像配准时可以解决图像局部弹性变换问题,实验结果验证了本文的结论。

References

[1]  Brown B J, Rusinkiewicz S. Non-rigid range-scan alignment using thin-plate splines [ A ] . In: Proceedings of the 2nd International Symposium on 3D Data Processing, Visualization and Transmission [C] , Thessalonica, Greece, 2004 : 759-765.
[2]  Ruprecht D, MUller H. Free form deformation with scattered data interpolation methods [ A ] . In: Computing Supplementum [C] , London,UK, 1993 : 267-281.
[3]  Fornefett M, Rohr K, Stiehl S. Elastic registration of medical images using radial basis functions with compact support [ A ]. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition[C], Fort Collins. Colorado. USA. 1999-402-A07
[4]  Arad N, Reisfeld D. Image warping using few anchor points and radial functions [ J ]. Computer Graphics Forum, 1995, 14 ( 1 ) : 35 -46.
[5]  Bookstein Fred L. Principal warps: Thin-plate splines and the decomposition of deformations [J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1989, 2(6) : 567-585.
[6]  Likar B, Pernus F. A hierarchical approach to elastic registration based on mutual information [J]. Image and Vision Computing, 2001,19(1) : 33-44.
[7]  Donatol G, Belongie S. Approximate thin plate spline mappings[ A]. In: Proceedings of the 7^th European Conference on Computer Vision [C], Copenhagen, Denmark,2002: 531-542.
[8]  Fornefett M, Rohr K, Stichl H. Radial basis functions with compact support for elastic registration of medical images [J]. Image and Vision Computing,2001,19(1-2) :87-96.
[9]  Sim Dong-Gyu ,Kwon Oh-Kyu ,Park Rae-Hong. Object matching algorithm using robust Hausdorff distance measures [J]. IEEE Transactions on Image Processing,1999,8 (3) :425-429.

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