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零电压零电流转换软开关技术中二极管反向恢复的影响

DOI: 10.13334/j.0258-8013.pcsee.2015.04.023, PP. 944-952

Keywords: 零电压零电流软开关技术,软开关,二极管反向恢复,损耗模型,开关损耗

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Abstract:

采用谐振极型零电压零电流软开关技术(zero-voltage/zero-currenttransition,ZVZCT)旨在消除功率器件的开关损耗,但实际上在软开关谐振换流过程中会引入多次额外的二极管反向恢复过程,产生额外的损耗。由于软开关换流过程中的特殊性,采用一般的方法难以对反向恢复过程中的损耗进行评估和计算,给ZVZCT软开关设计带来了困难。该文在考虑二极管反向恢复过程的基础上,详细介绍了ZVZCT软开关技术的换流过程。通过引入二极管载流子寿命以及电荷控制方程,提出了一种适用于软开关换流条件下的二极管反向恢复损耗模型。最后,通过软开关组件的双脉冲实验验证了该二极管反向恢复损耗模型的正确性。研究表明,采用ZVZCT技术的软开关设备的开关损耗与开关器件的二极管反向恢复特性直接相关。

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