全部 标题 作者
关键词 摘要

OALib Journal期刊
ISSN: 2333-9721
费用:99美元

查看量下载量

相关文章

更多...
科学通报  2011 

CHF3/Ar等离子体刻蚀BST薄膜的机理研究

, PP. 1477-1480

Keywords: 钛酸锶钡,反应离子刻蚀,光电子能谱,等离子体

Full-Text   Cite this paper   Add to My Lib

Abstract:

采用XPS方法,通过对刻蚀前后BST(钛酸锶钡)薄膜表面成分、元素化合态以及原子相对百分含量分析,探讨了CHF3/Ar等离子刻蚀BST薄膜的RIE(反应离子刻蚀)机理.研究结果表明,在刻蚀过程中,金属Ba,Sr,Ti和F等离子体发生化学反应并生成相应的氟化物且部分残余在薄膜表面,因为TiF4具有高挥发特性,残余物几乎没有钛氟化物.然而,XPS表明Ti-F仍然少量存在,认为是存在于Metal-O-F这种结构中,而O1s进一步证实了Metal-O-F的存在.基于原子的相对百分含量,我们发现刻蚀后薄膜表面富集氟,源于高沸点的氟化物BaF2和SrF2沉积,导致刻蚀速度仅达12.86nm/min.同时并没有发现C-F多聚物的形成,因此去除残余物BaF2和SrF2有利于进一步刻蚀.针对这种分析结果,本文提出对BST薄膜每4min刻蚀后进行1minAr等离子体物理轰击方案,发现残余物得以去除.

References

[1]  Gervais M, Gervais F, Champeaux C, et al. Strongly oriented BST films on La0.9Sr1.1NiO4 electrodes deposited on various substrates for integration of high capacitances on silicon. Appl Surf Sci, 2006, 252: 3085–3091 [2] Gaillot D P.[J].Zhao Q, Zhang F L, et al. Transparency cloak based on High-κ BST rods. In: Proceedings of the 38th EuMC.2008,:- [3] Noda M, Inoue K, Zhu H, et al. Chopperless-operated dielectric bolometer mode of infrared image sensor with ferroelectric BST film using improved operation. IEEE I SAF, 2000, 2: 783–786 [4] Belleville P, Bigarre J, Boy P, et al. Stable PZT sol for preparing reproducible high-permittivity perovskite-based thin films. J Sol-Gel Sci Technol, 2007, 43: 213–221 [5] Ahamed F, Biggers R, Campbell A, et al. New research directions in tunable microwave dielectrics. Integr Ferroelectr, 2004, 66: 139–151 [6] Challali F, Besland M P, Benzeggouta D, et al. Investigation of BST thin films deposited by RF magnetron sputtering in pure Argon. Thin Solid Films, 2010, 518: 4619–4622 [7] Hu W C, Yang C R, Zhang W L, et al. Ferroelectric properties of Ba0.8Sr0.2TiO3 thin films prepared by RF magnetron sputtering. Integr Ferroelectr, 2006, 79: 131–138 [8] Palathinkal T J, Cheng H F, Lee Y C, et al. Low loss tunable thick films based on (Ba,Sr)TiO3 and Ba4Ti13O30 materials[J].Integr Ferroelectr.2004, 66:213- [9] Kim S B, Kim C-Il, Chang E G. Study on surface reaction of Ba,Sr.TiO3 thin films by high density plasma etching. J Vac Sci Technol A, 1999, 17: 2156–2161 [10] Stafford L, Margot J, Langlois O. Barium–strontium–titanate etching characteristics in chlorinated discharges. J Vac Sci Technol A, 2003, 21: 1247–1252 [11] Kim S B, Lee Y H, Kim T H, et al. Etching mechanism of Ba,Sr.TiO3 films in high density Cl2/BCl3/Ar plasma. J Vac Sci Technol A, 2000, 18: 1381–1384 [12] Choi S K, Kim D P, Kim C-II, et al. Damage in etching of Ba,Sr.TiO3 thin films using inductively coupled plasma. J Vac Sci Technol A, 2001, 19: 1063–1067 [13] Kim G H, Kim K T, Kim C-II. Dry etching of Ba,Sr.TiO3 thin films using an inductively coupled plasma. J Vac Sci Technol A, 2005, 23: 894–897 [14] Zhang B, Quan Z C, Zhang T J, et al. Effect of oxygen gas and annealing treatment for magnetically enhanced reactive ion etched (Ba0.65,Sr0.35)TiO3 thin films. J Appl Phys, 2007, 101: 014107 [15] Shibano T, Takenaga T, Nakamura K, et al. Etching of Ba,Sr.TiO3 film by chlorine plasma. J Vac Sci Technol A, 2000, 18: 2080–2084 [16] Wu D S, Lin C C, Horng R H, et al. Etching characteristics and plasma-induced damage of high-k Ba0.5Sr0.5TiO3 thin-film capacitors. J Vac Sci Technol B, 2001, 19: 2231–2236 [17] Kang P S, Kim K T, Kim D P, et al. Study of damage reduction of Ba0.6,Sr0.4.TiO3 thin films etched in Ar/CF4 plasmas. J Vac Sci Technol A, 2003, 21: 1469–1474
[2]  Gervais M, Gervais F, Champeaux C, et al. Strongly oriented BST films on La0.9Sr1.1NiO4 electrodes deposited on various substrates for integration of high capacitances on silicon. Appl Surf Sci, 2006, 252: 3085–3091
[3]  Gaillot D P.[J].Zhao Q, Zhang F L, et al. Transparency cloak based on High-κ BST rods. In: Proceedings of the 38th EuMC.2008,:-
[4]  Noda M, Inoue K, Zhu H, et al. Chopperless-operated dielectric bolometer mode of infrared image sensor with ferroelectric BST film using improved operation. IEEE I SAF, 2000, 2: 783–786
[5]  Belleville P, Bigarre J, Boy P, et al. Stable PZT sol for preparing reproducible high-permittivity perovskite-based thin films. J Sol-Gel Sci Technol, 2007, 43: 213–221
[6]  Ahamed F, Biggers R, Campbell A, et al. New research directions in tunable microwave dielectrics. Integr Ferroelectr, 2004, 66: 139–151
[7]  Challali F, Besland M P, Benzeggouta D, et al. Investigation of BST thin films deposited by RF magnetron sputtering in pure Argon. Thin Solid Films, 2010, 518: 4619–4622
[8]  Hu W C, Yang C R, Zhang W L, et al. Ferroelectric properties of Ba0.8Sr0.2TiO3 thin films prepared by RF magnetron sputtering. Integr Ferroelectr, 2006, 79: 131–138
[9]  Palathinkal T J, Cheng H F, Lee Y C, et al. Low loss tunable thick films based on (Ba,Sr)TiO3 and Ba4Ti13O30 materials[J].Integr Ferroelectr.2004, 66:213-
[10]  Kim S B, Kim C-Il, Chang E G. Study on surface reaction of Ba,Sr.TiO3 thin films by high density plasma etching. J Vac Sci Technol A, 1999, 17: 2156–2161
[11]  Stafford L, Margot J, Langlois O. Barium–strontium–titanate etching characteristics in chlorinated discharges. J Vac Sci Technol A, 2003, 21: 1247–1252
[12]  Kim S B, Lee Y H, Kim T H, et al. Etching mechanism of Ba,Sr.TiO3 films in high density Cl2/BCl3/Ar plasma. J Vac Sci Technol A, 2000, 18: 1381–1384
[13]  Choi S K, Kim D P, Kim C-II, et al. Damage in etching of Ba,Sr.TiO3 thin films using inductively coupled plasma. J Vac Sci Technol A, 2001, 19: 1063–1067
[14]  Kim G H, Kim K T, Kim C-II. Dry etching of Ba,Sr.TiO3 thin films using an inductively coupled plasma. J Vac Sci Technol A, 2005, 23: 894–897
[15]  Zhang B, Quan Z C, Zhang T J, et al. Effect of oxygen gas and annealing treatment for magnetically enhanced reactive ion etched (Ba0.65,Sr0.35)TiO3 thin films. J Appl Phys, 2007, 101: 014107
[16]  Shibano T, Takenaga T, Nakamura K, et al. Etching of Ba,Sr.TiO3 film by chlorine plasma. J Vac Sci Technol A, 2000, 18: 2080–2084
[17]  Wu D S, Lin C C, Horng R H, et al. Etching characteristics and plasma-induced damage of high-k Ba0.5Sr0.5TiO3 thin-film capacitors. J Vac Sci Technol B, 2001, 19: 2231–2236
[18]  Kang P S, Kim K T, Kim D P, et al. Study of damage reduction of Ba0.6,Sr0.4.TiO3 thin films etched in Ar/CF4 plasmas. J Vac Sci Technol A, 2003, 21: 1469–1474

Full-Text

Contact Us

service@oalib.com

QQ:3279437679

WhatsApp +8615387084133