Aminian F, Aminian M. Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor[J]. IEEE Transactions on Circuits and System II: Analog and Digital Signal Processing, 2000, 47(2): 151-156.
[6]
Hamida N B, Kaminska B. Multiple fault analog circuit testing by sensitivity analysis[J]. Journal of Electronic Testing: Theory and Applications, 1993(4): 331-343.
Alippi C, Catelani M, Fort A, et al. Automated selection of test frequencies for fault diagnosis in analog electronic circuits[J]. IEEE Transactions on instrumentation and Measurement, 2005, 54(3): 1033-1044.