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功率器件散热特性的非稳态测量方法

, PP. 114-120

Keywords: 散热特性,功率器件,非稳态导热,热阻,测量

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Abstract:

采用集总参数法对功率器件的散热体系进行了分析,推导了功率器件非稳态导热过程中温度变化的规律,给出了一种通过测量非稳态导热过程中的温度变化曲线确定散热体系特性参数的方法。以模块电源为例,实际测量了在不同状态下电源模块升温及降温过程中的温度变化特性。测试结果与理论预测基本相符,表明这种方法可有效用于工程实际中。该方法不仅可以避免冗繁的计算,且通过实验可方便地测试出功率器件的散热特性,并能够预测其使用过程中的最大温升,尤其适用于散热结构复杂、散热边界条件不易确定的应用场合。

References

[1]  Xie X L, He Y L, Tao W Q, et al. An experimental investigation on a novel high-performance integrated heat pipe-heat sink for high-flux chip cooling[J]. Applied Thermal Engineering, 2008, 28: 433-439.
[2]  Sauciuc I, Chrysler G, Mahajan R, et al. Spreading in the heat sink base: phase change systems or solid metals[J]. IEEE Transactions on Components and Packaging Technologies, 2002, 25(4): 621-628.
[3]  Xiong D X, Azar K, Tavassoli B. High capacity, compact hybrid air cooling system[C]. Thermal and Thermomechanical Phenomena in Electronics Systems-Proceedings of the Intersociety Conference, 2006: 786-790.
[4]  金雍, 羊彦, 等. 功率半导体器件温度状态的实时预测技术[J]. 电工技术学报, 2001, 16(5): 68-72.
[5]  Etemoglu A B. A brief survey and economical analysis of air cooling for electronic equipments[J]. International Communications in Heat and Mass Transfer, 2007, 34: 103-113.
[6]  Salem T E, Ibitayo D, Geil B R. Validation of infrared camera thermal measurements on high-voltage power electronic components[J]. IEEE Transactions on Instrument and Measurement, 2007, 56 (5): 1973-1978.
[7]  胡建辉, 李锦庚, 邹继斌等. 变频器中的IGBT模块损耗计算及散热系统设计[J]. 电工技术学报, 2009, 24(3): 159-163.
[8]  Ozturk E, Tari I. Forced air cooling of CPUs with heat sinks: a numerical study[J]. IEEE Transaction on Components and Packging Technologies, 2008, 31(3): 650-660.
[9]  Malinarič S. Uncertainty analysis of thermophysical property measurements of solids using dynamic methods[J]. International Journal of Thermophysics, 2007, 28(1): 20-32.
[10]  Štofanikl V, Markovič M, Boháč V, et al. RT-Lab the equipment for measuring thermophysical properties by transient methods[J]. Measurement Science Review, 2007, 7(3): 15-18.
[11]  Filicori F, Rinaldi P, Vannini G, et al. A new technique for thermal resistance measurement in power electron devices[J]. IEEE Transactions on Instrumentation and Measurement, 2005, 54(5): 1921-1925.

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