William Q Meeker,Michael Hamada.Statistical tools for the rapid development & evaluation of high-reliability products[J].IEEE Transactions on Reliability,1995,44(2):187-198
[2]
Jong In Park,Suk Joo Bae.Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests[J].IEEE Transactions on Reliability,2010,59(1):74-90
[3]
Meeker W Q,Escobar L A,Lu J C.Accelerated degradation tests:modeling and analysis[J].Technometrics,1998,40(2):89-99
[4]
Jong In Park,Suk Joo Bae.Direct prediction methods on lifetime distribution of organic light-emitting diodes from accelerated degradation tests[J].IEEE Transactions on Reliability,2010,59(1):74-90
[5]
郑德强,张正平,李海波,等.加速退化试验技术研究、应用与发展[J].装备环境工程,2011,8(2):100-104 Zheng Deqiang,Zhang Zhengping,Li Haibo,et al.Research,application and development of accelerated degradation test technology[J].Equipment Environmental Engineering,2011,8(2):100-104(in Chinese)
[6]
Michal Tencer,John Seaborn Moss,Trevor Zapach.Arrhenius average temperature:the effective temperature for non-fatigue wearout and long term reliability in variable thermal conditions and climates[J].IEEE Transactions on Components and Packaging Technologies,2004,27(3):602-607
[7]
郑德强,张正平,李海波,等.加速退化试验技术研究、应用与发展[J].装备环境工程,2011,8(2):100-104 Zheng Deqiang,Zhang Zhengping,Li Haibo,et al.Research,application and development of accelerated degradation test technology[J].Equipment Environmental Engineering,2011,8(2):100-104(in Chinese)
[8]
Michal Tencer,John Seaborn Moss,Trevor Zapach.Arrhenius average temperature:the effective temperature for non-fatigue wearout and long term reliability in variable thermal conditions and climates[J].IEEE Transactions on Components and Packaging Technologies,2004,27(3):602-607
[9]
姜仁元,张兴唐,杨亦春.温度应力下功能退化型加速寿命试验问题研究[J].南京理工大学学报,2000,24(6):523-527 Jiang Renyuan,Zhang Xingtang,Yang Yichun.Study on accelerated life test of function degenerating type by temperature stress[J].Journal of Nanjing University of Science and Technology,2000,24(6):523-527(in Chinese)
[10]
姜仁元,张兴唐,杨亦春.温度应力下功能退化型加速寿命试验问题研究[J].南京理工大学学报,2000,24(6):523-527 Jiang Renyuan,Zhang Xingtang,Yang Yichun.Study on accelerated life test of function degenerating type by temperature stress[J].Journal of Nanjing University of Science and Technology,2000,24(6):523-527(in Chinese)
[11]
潘荣霖.飞航导弹惯性器件[M].北京:宇航出版社,1991:390-391 Pan Ronglin.Inertia devices of winged missiles[M].Beijing:Astronautics Press,1991:390-391 (in Chinese)
[12]
潘荣霖.飞航导弹惯性器件[M].北京:宇航出版社,1991:390-391 Pan Ronglin.Inertia devices of winged missiles[M].Beijing:Astronautics Press,1991:390-391 (in Chinese)
[13]
王春爱.高精度加速度计的结构设计 .南京:东南大学仪器科学与工程学院,2009 Wang Chun-ai.Mechanical structure design of high resolution accelerometer .Nanjing:School of Instrument Science and Engineering,Southeast University,2009(in Chinese)
[14]
王春爱.高精度加速度计的结构设计 .南京:东南大学仪器科学与工程学院,2009 Wang Chun-ai.Mechanical structure design of high resolution accelerometer .Nanjing:School of Instrument Science and Engineering,Southeast University,2009(in Chinese)
