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高压及热处理对氮碳薄膜激光诱导荧光效率的影响

DOI: 10.11858/gywlxb.1999.03.003, PP. 173-177

Keywords: 氮碳薄膜,金刚石高压容器,荧光光谱

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Abstract:

应用激光激发荧光光谱实验对经热处理后及高压条件下的氮碳薄膜荧光光谱进行了测量分析。实验显示,热处理效应和高压效应均导致薄膜荧光效率降低,前者表现为不可恢复,后者为可恢复即卸压后荧光效率的恢复,表明导致荧光光谱效率降低的微观机制不同,为氮碳薄膜荧光模型提供了新的实验证据。

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