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CdSe在高压下的电学性质及相变

DOI: 10.11858/gywlxb.2008.01.009, PP. 39-42

Keywords: 高压,原位电阻率测量,结构相变,金属化

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Abstract:

利用在金刚石压砧上集成的微电路,原位测量了CdSe多晶粉末在温度为300~450K、压力达到23GPa时电阻率随温度和压力的变化关系。实验结果表明:在加压过程中,电阻率在2.6GPa压力时出现的异常改变,对应着CdSe从纤锌矿向岩盐矿结构的转变,而在6.0、9.8、17.0GPa等压力处出现的电阻率异常,则是由CdSe中的电子结构的变化所引起的;在卸压过程中,只在约14.0和3.0GPa压力下观察到了两个电阻率异常点。通过对电阻率随压力变化曲线的模拟,得出了CdSe高压相的带隙随压力的变化关系,据此预测CdSe金属化的压力应在70~100GPa之间。变温实验结果表明,在实验的温度和压力范围内,CdSe的电阻率均随温度的增加而升高。

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