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工程力学  2014 

基于显式动力学的焊点冲击失效分析

DOI: 10.6052/j.issn.1000-4750.2012.09.0655, PP. 193-200

Keywords: 显式动力学,冲击,电子封装,焊点,内聚力模型

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Abstract:

组件级高速剪切测试是用来研究芯片封装中Sn-Ag-Cu焊点冲击可靠性问题的一个重要手段。实验研究表明:随着冲击速度的增加,焊点封装结构的失效会由焊锡母材的韧性破坏向界面金属间化合物(IMC)的脆性断裂过渡;同时,其荷载-位移响应曲线形态也会发生显著的改变。为了能够更详细地了解封装结构的冲击失效行为,并进一步改进其结构设计,该文提出结合焊锡材料应变率相关的动态硬化特性,利用渐进损伤模型来模拟其动态损伤过程;同时,引进一种能够有效表征复合型裂纹扩展的内聚力模型来模拟IMC的脆性动态断裂。与实验结果的对比表明:该文提出的方法能够较为有效地表征焊点封装结构在不同冲击速度下的失效行为。

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