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工程力学  2012 

粗糙度模式对硬盘气膜承载特性的影响

DOI: 10.6052/j.issn.1000-4750.2010.12.0867, PP. 313-318

Keywords: 机械设计及理论,期刊论文,数值模拟,气膜,雷诺方程,表面粗糙度,承载力

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Abstract:

当前硬盘中磁头磁盘之间气膜的厚度已经接近或低于分子平均自由程,在这种情况下表面粗糙度及气体稀薄效应的影响不容忽视.应用最小二乘有限差分法,求解考虑气体稀薄效应并引入压力流因子和剪切流因子的量纲一雷诺方程,研究了不同粗糙度模式下硬盘超低飞高(1nm~2nm)气膜的承载特性.数值结果表明:粗糙度模式对超低飞高气膜压力分布及承载力的影响较大,而对压力中心的影响较小;在各种粗糙度模式情形下,磁头取横向粗糙度模式时,可使气膜压力分布升高,并提高气膜的承载力.

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