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Effect of Y on the Properties of Sm-Doped Ceria for IT-SOFC Applications

DOI: 10.4236/jmp.2013.411181, PP. 1499-1503

Keywords: X-Ray, Scanning Electron Microscopy, Thermal Expansion, Electrical Conductivity

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Abstract:

The co-doped ceria-based materials with general composition formula Ce0.8-xYxSm0.2O2-δ (x = 0, 0.02, 0.04, 0.06) were prepared through the sol-gel method. The single phase of the prepared materials was confirmed by X-ray diffraction (XRD). The lattice parameters were determined by least square fitting of UNIT CELL programme. The linear variation of lattice parameter with concentration of Y into the samarium doped ceria (SDC) indicates the validity of Vegard’s law. The crystallite size of the samples obtained by using of Scherrer formula is in the range from 34 nm to 49 nm. The thermal expansion studies were carried out by using dilatometric technique in the temperature range from room temperature to 1000°C. It was observed that the thermal expansion increased linearly with increasing temperature for all the samples. The electrical conductivity was studied using impedance spectroscopy. It was observed that the composition Ce0.74Y0.06Sm0.2O2-

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