At the vacuum-ultraviolet (VUV) beam line of a
synchrotron, an end station for photoluminescence (PL) coupled to a system to
detect absorption is used to investigate the luminescence and absorption of
materials. We analyzed a CVD diamond window in wavelength range 160-250 nm
at 300 and 14 K. The PL excited with VUV light enabled an identification of
nitrogen defects in diamond samples. The VUV PL technique is applicable to
explore advanced materials including materials with similar wide band gaps,
such as boron nitride and aluminum nitride.
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