INVESTIGATION OF OPTICAL PROPERTIES OF SbS THIN FILMS

Thin films of SbS have been deposited by vacuum evaporation technique onto highly cleaned glass substrates under vacuum of the order 10 torr. The structure of the films was determined by their X-ray diffraction patterns and AFM images. Transmittance measurements in the wavelength range (500-1100 nm) were used to compute the refractive index using the Swanepoel’s method. The optical properties of these thin films have been investigation from transmission spectra by using Wemple-DiDomenico single oscillator model. These films posed, in general good transparency, exhibiting an interference pattern. The wavelength dependence of refractive index and extinction coefficient of these films has been reported.