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Raman and IR spectra of pure and doped forsterite single crystals

DOI: 10.2298/sos0901043g

Keywords: forsterite , x-Ray diffraction , IR spectra , Raman spectra , optical properties

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Abstract:

Forsterite single crystals were grown by the Czochralski technique in air. The lattice parameters were determined by X-ray power diffraction. The IR and Raman spectra of pure and doped (V3+, V5+, and Ni4+) Mg2SiO4 single crystals were measured at room temperature. We studied the phonon properties and discussed the influence of dopants.

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