Response to Selection in Sorghum for Resistance to Head Bug (Eurystylus oldi Poppius)

Early generation selection based on pedigree selection procedures was applied on F2 populations of Sorghum to select and improve the level of resistance to Sorghum head bug (E. oldi). The base population (F2), F2:3, F2:4 and 6 checks (3 resistant and 3 susceptible cultivars) were evaluated for 4 resistance traits in a randomized block design. Reduction of 178 and 407 head bugs/5 panicles for F2:3 and F2:4 generation was obtained which corresponded to 39.65 and 17.75% of percentage gain/generation of selection. The grain damage rating also reduces considerably. Percentage gain/generation of 57.00 and 59.76 for F2:3 and F2:4 for their grain yield was obtained. Significant but negative phenotypic and genotypic correlations were obtained except for 1000-grain weight, similar trend was observed for correlated response. High percent genetic gain was recorded for all the traits at both generations of selection.