全部 标题 作者
关键词 摘要

OALib Journal期刊
ISSN: 2333-9721
费用:99美元

查看量下载量

相关文章

更多...

Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy

DOI: 10.1155/2010/279608

Full-Text   Cite this paper   Add to My Lib

Abstract:

New TEM grids coated with ultrathin amorphous films have been developed using atomic layer deposition technique. The amorphous films can withstand temperatures over in air and in vacuum when the thickness of the film is 2?nm, and up to in air when the thickness is 25?nm, which makes heating TEM grids with nanoparticles up to in air and immediate TEM observation without interrupting the nanoparticles possible. Such coated TEM grids are very much desired for applications in high-temperature high-resolution transmission electron microscopy. 1. Introduction High-temperature high-resolution transmission electron microscopy (HRTEM) has been widely utilized to study the dynamic behaviors of nanoparticles at elevated temperatures [1–11], such as morphology [1], oxidation [2], melting [3–5], structural transformation [6], evaporation [7], recrystallization [8], phase stability [9], and growth [10] of nanoparticles. In these high-temperature HRTEM investigations, the supporting films coated on TEM grids should be thin enough (not to blur the HRTEM images of nanoparticles) and be mechanically stable (to support the nanoparticles) up to several hundred Celsius right before TEM observation without postheating processing. Unfortunately such ideal ultra-thin and mechanically stable supporting films are not available. The conventional ultra-thin carbon supporting films with thickness of several nanometers are suitable for HRTEM imaging and electron diffraction patterning at room temperature and in vacuum [12]. However, the carbon supporting films are not mechanically stable at high temperatures, always break in vacuum or burn away in air upon heating. In order to improve mechanical stability of the carbon supporting films, a thermally stable silicon oxide was deposited on the conventional carbon films using sputtering method [13]. The deposited oxide films were too thick and blurred HRTEM images while the quality of the deposited oxide films was hard to be controlled because of the sputtering deposition technique. Gold-platinum alloys [14] and germanium films [15] were also sputtered on the carbon supporting films, but the coated films were only suitable for HRTEM up to C in vacuum and could not resist oxidization in air at high temperatures. In order to withstand temperatures higher than C, silicon-based membrane window grids, like silicon oxide membranes [16] and silicon nitride membranes[17], have recently been developed to meet the new requirement of high-temperature TEM experiments. These commercial membrane window grids can withstand temperatures up to C in air

References

[1]  R. J. Spontak, J. L. Burns, and C. J. Echer, “Morphological studies of nanoclusters on grid-supported polymer thin films,” Journal of Materials Research, vol. 7, no. 9, pp. 2593–2598, 1992.
[2]  C. E. Kliewer, G. Kiss, and G. J. DeMartin, “Ex situ transmission electron microscopy: a fixed-bed reactor approach,” Microscopy and Microanalysis, vol. 12, no. 2, pp. 135–144, 2006.
[3]  R. Kofman, P. Cheyssac, Y. Lereah, and A. Stella, “Melting of clusters approaching 0D,” European Physical Journal D, vol. 9, no. 1–4, pp. 441–444, 1999.
[4]  Z. L. Wang, J. M. Petroski, T. C. Green, and M. A. El-Sayed, “Shape transformation and surface melting of cubic and tetrahedral platinum nanocrystals,” Journal of Physical Chemistry B, vol. 102, no. 32, pp. 6145–6151, 1998.
[5]  Q. Xu, I. D. Sharp, C. W. Yuan et al., “Large melting-point hysteresis of Ge nanocrystals embedded in ,” Physical Review Letters, vol. 97, no. 15, Article ID 155701, 4 pages, 2006.
[6]  K. Koga, T. Ikeshoji, and K.-I. Sugawara, “Size- and temperature-dependent structural transitions in gold nanoparticles,” Physical Review Letters, vol. 92, no. 11, Article ID 115507, 4 pages, 2004.
[7]  K. K. Nanda, F. E. Kruis, and H. Fissan, “Evaporation of free PbN nanoparticles: evidence of the Kelvin effect,” Physical Review Letters, vol. 89, no. 25, Article ID 256103, 4 pages, 2002.
[8]  P. W. Sutter and E. A. Sutter, “Dispensing and surface-induced crystallization of zeptolitre liquid metal-alloy drops,” Nature Materials, vol. 6, no. 5, pp. 363–366, 2007.
[9]  H. Yasuda, K. Mitsuishi, and H. Mori, “Particle-size dependence of phase stability and amorphouslike phase formation in nanometer-sized Au-Sn alloy particles,” Physical Review B, vol. 64, no. 9, Article ID 094101, 6 pages, 2001.
[10]  H. Yasuda, A. Tanaka, K. Matsumoto, N. Nitta, and H. Mori, “Formation of porous GaSb compound nanoparticles by electronic-excitation- induced vacancy clustering,” Physical Review Letters, vol. 100, no. 10, Article ID 105506, 4 pages, 2008.
[11]  Y. Lan, H. Wang, X. Chen, D. Wang, G. Chen, and Z. Ren, “Nanothermometer using single crystal silver nanospheres,” Advanced Materials, vol. 21, no. 47, pp. 4839–4844, 2010.
[12]  R. C. Williams and R. M. Glaeser, “Ultrathin carbon support films for electron microscopy,” Science, vol. 175, no. 4025, pp. 1000–1001, 1972.
[13]  D. L. Jernigan and J. L. McAtee Jr., “The study of carbon-coated grids at elevated temperatures by electron microscopy,” Thermochimica Acta, vol. 4, no. 3–5, pp. 393–404, 1972.
[14]  S. Janbroers, T. R. de Kruijff, Q. Xu, P. J. Kooyman, and H. W. Zandbergen, “Preparation of carbon-free TEM microgrids by metal sputtering,” Ultramicroscopy, vol. 109, no. 9, pp. 1105–1109, 2009.
[15]  B. V. Johansen and H. Ormstad, “Evaporated germanium films as supports for microanalysis of carbon and silicon containing specimens,” Microscopy Research and Technique, vol. 38, no. 5, pp. 519–524, 1997.
[16]  G. J. Kearns, E. W. Foster, and J. E. Hutchison, “Substrates for direct imaging of chemically functionalized surfaces by transmission electron microscopy,” Analytical Chemistry, vol. 78, no. 1, pp. 298–303, 2006.
[17]  A. W. Grant, Q.-H. Hu, and B. Kasemo, “Transmission electron microscopy ‘windows’ for nanofabricated structures,” Nanotechnology, vol. 15, no. 9, pp. 1175–1181, 2004.
[18]  M. Leskel? and M. Ritala, “Atomic layer deposition chemistry: recent developments and future challenges,” Angewandte Chemie International Edition, vol. 42, no. 45, pp. 5548–5554, 2003.
[19]  N. P. Kobayashi, C. L. Donley, S.-Y. Wang, and R. S. Williams, “Atomic layer deposition of aluminum oxide on hydrophobic and hydrophilic surfaces,” Journal of Crystal Growth, vol. 299, no. 1, pp. 218–222, 2007.
[20]  S. Jakschik, U. Schroeder, T. Hecht, M. Gutsche, H. Seidl, and J. W. Bartha, “Crystallization behavior of thin ALD- films,” Thin Solid Films, vol. 425, no. 1-2, pp. 216–220, 2003.
[21]  L. Zhang, H. C. Jiang, C. Liu, J. W. Dong, and P. Chow, “Annealing of thin films prepared by atomic layer deposition,” Journal of Physics D, vol. 40, no. 12, pp. 3707–3713, 2007.
[22]  P. Eklund, M. Sridharan, G. Singh, and J. B?ttiger, “Thermal stability and phase transformations of -amorphous- thin films,” Plasma Processes and Polymers, vol. 6, no. S1, pp. S907–S911, 2009.
[23]  Z. Lee, K.-J. Jeon, A. Dato et al., “Direct imaging of soft-hard interfaces enabled by graphene,” Nano Letters, vol. 9, no. 9, pp. 3365–3369, 2009.

Full-Text

Contact Us

service@oalib.com

QQ:3279437679

WhatsApp +8615387084133