Differential interferometry in planar waveguide structures with ferronematic layer

The paper presents a differential interferometry phenomenon in a planar optical structure, which uses a ferronematic layer of a liquid crystal. This layer changes propagation conditions for TM modes in external magnetic field. Due to the magnetic field action on a ferronematic layer which covers the planar waveguide coated with an additional orientative layer, the ellipsoid of the refractive index changes its orientation in a polarization plane of the TM mode. In consequence, the phase difference of the TM mode occurs under magnetic field influence. This paper provides an analysis of the influence of a thickness and a refractive index of the orientative layer on interference phenomenon in analyzed structure.