Analysis of Multi-Wavelength Overlapping Chromatographic Data by Orthogonal Projection Resolution
正交投影用于多波长色谱重叠峰分析

Orthogonal projection resolution(OPR) has been proved to be a high performance chromatographic data processing technique.In this paper,it is applied to the resolution of multi-wavelength chromatographic overlapping peaks. When the highest number of degree of overlapping in chromatogram is less than or equal to the number of wavelengths used, a real resolved chromatogram can be completely obtained from multi-wavelength chromatographic overlapping peaks by this method. When based on dual wavelength chromatographic data analysis, a new method, namely dual wavelength characteristic information analysis(DWCI), used for the base line correction, determination of number of components and region of pure components signal. Analysis of overlapping cases of every components in the overlapping chromatogram is also proposed.DWCI has been successfully used for the analysis of overlapping chromatogram with dual peaks of three components and with single peak of two components. But based on single wavelength chromatographic data, the analysis of these overlapping peaks is a very difficult and complicated problem.